Projects per year
Abstract
Speckle metrology is a powerful tool in the measurement of wavelength and spectra. Recently, speckle produced by multiple reflections inside an integrating sphere has been proposed and showed high performance. However, to our knowledge, a complete characterisation of speckle sensitivity to wavelength in that geometry has not been performed to date. In this work, we derive a general model predicting the variation in a speckle pattern as a result of a generic transformation. Applying this to a shift in the incident wavelength, we show that the speckle sensitivity is mainly governed by the radius and surface reflectivity of the sphere. We show that integrating spheres offer sensitivity four orders of magnitude above that of multimode fibres of a similar size, and discuss analogies with the transmission profile of a Fabry–Pérot interferometer.
Original language | English |
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Article number | 035005 |
Number of pages | 8 |
Journal | Journal of Physics: Photonics |
Volume | 3 |
Issue number | 2 |
DOIs | |
Publication status | Published - 29 Jul 2021 |
Keywords
- Speckle patterns
- Spectrometry
- Integrating sphere
- Wavemeter
- Metrology
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Dive into the research topics of 'Wavelength sensitivity of the speckle patterns produced by an integrating sphere'. Together they form a unique fingerprint.Projects
- 2 Finished
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Making the most of interference: Making the most of interference: new metrology application of laser speckle
Dholakia, K. (PI)
1/09/17 → 30/11/20
Project: Standard
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Resonant and shaped photonics for under: Resonant and shaped photonics for understanding the physical and biomedical world
Dholakia, K. (PI) & Gather, M. C. (CoI)
1/08/17 → 31/07/22
Project: Standard
Datasets
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Data underpinning "Wavelength sensitivity of the speckle patterns produced by an integrating sphere"
Facchin, M. (Creator), Dholakia, K. (Creator) & Bruce, G. D. (Creator), University of St Andrews, 8 Aug 2021
DOI: 10.17630/323aebbc-6063-4f71-be41-0e73b45d4997, https://doi.org/10.17630/sta/419
Dataset
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