VerSoX B07‐B: a high‐throughput XPS and ambient pressure NEXAFS beamline at Diamond Light Source

David C. Grinter*, Pilar Ferrer, Federica Venturini, Matthijs A. van Spronsen, Alexander I. Large, Santosh Kumar, Maximilian Jaugstetter, Alex Iordachescu, Andrew Watts, Sven L. M. Schroeder, Anna Kroner, Federico Grillo, Stephen M. Francis, Paul B. Webb, Matthew Hand, Andrew Walters, Michael Hillman, Georg Held

*Corresponding author for this work

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Abstract

The beamline optics and endstations at branch B of the Versatile Soft X‐ray (VerSoX) beamline B07 at Diamond Light Source are described. B07‐B provides medium‐flux X‐rays in the range 45–2200 eV from a bending magnet source, giving access to local electronic structure for atoms of all elements from Li to Y. It has an endstation for high‐throughput X‐ray photoelectron spectroscopy (XPS) and near‐edge X‐ray absorption fine‐structure (NEXAFS) measurements under ultrahigh‐vacuum (UHV) conditions. B07‐B has a second endstation dedicated to NEXAFS at pressures from UHV to ambient pressure (1 atm). The combination of these endstations permits studies of a wide range of interfaces and materials. The beamline and endstation designs are discussed in detail, as well as their performance and the commissioning process.
Original languageEnglish
Number of pages12
JournalJournal of Synchrotron Radiation
Volume31
Issue number3
Early online date26 Mar 2024
DOIs
Publication statusPublished - May 2024

Keywords

  • High throughput
  • Ambient pressure
  • NEXAFS
  • XPS
  • X‐ray photoelectron spectroscopy

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