Variable-Temperature Microcrystal X-ray Diffraction Studies of Negative Thermal Expansion in the Pure Silica Zeolite IFR

Chemistry

• Thermal Expansion 100%
• Purity 100%
• X-Ray Diffraction 100%
• Silicon Dioxide 100%
• Atomic Coordinate 33%
• Single Crystal X-Ray Diffraction 33%

Engineering

• Ray Diffraction 100%
• Pure Silica 100%
• Ray Source 50%
• Temperature Range 50%
• Great Detail 50%
• Single Temperature 50%

Chemical Engineering

• Microcrystals 100%
• Negative Thermal Expansion 100%