Unveiling the significance of intrinsic sensitivity and multiple scattering in speckle metrology

Morgan Facchin; Saba N. Khan; Kishan Dholakia; Graham D. Bruce

Unveiling the significance of intrinsic sensitivity and multiple scattering in speckle metrology

Morgan Facchin, Saba N. Khan, Kishan Dholakia, Graham D. Bruce

Research output: Working paper › Preprint

Abstract

Speckle patterns are a powerful tool for high-precision metrology, as they allow remarkable performance in relatively simple setups. Nonetheless, researchers in this field follow rather distinct paths due to underappreciated general principles underlying speckle phenomena. Here, we advise on a universal metric of intrinsic speckle sensitivity, and on the advantages and disadvantages of multiple scattering. This will catalyse progress in speckle metrology but will also translate to other domains of disordered optics which are undergoing rapid developments at present.

Original language	English
Publisher	arXiv
Publication status	Published - 28 Mar 2024

Access to Document

http://arxiv.org/abs/2403.19301

M Squared - USTAN Biophotonics Nexus: M Sqaured - St Andrews Biophotonics Nexus
Dholakia, K. (PI)
EPSRC
1/11/17 → 31/10/22
Project: Standard
Making the most of interference: Making the most of interference: new metrology application of laser speckle
Dholakia, K. (PI)
The Leverhulme Trust
1/09/17 → 30/11/20
Project: Standard
Resonant and shaped photonics for under: Resonant and shaped photonics for understanding the physical and biomedical world
Dholakia, K. (PI) & Gather, M. C. (CoI)
1/08/17 → 31/07/22
Project: Standard

Data underpinning "Determining intrinsic sensitivity and the role of multiple scattering in speckle metrology"
Facchin, M. (Creator), Khan, S. (Creator), Dholakia, K. (Creator) & Bruce, G. D. (Creator), University of St Andrews, 13 Nov 2024
DOI: 10.17630/bcb2bff1-0d20-454a-89c5-8fd64b9e8ff8
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Cite this

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title = "Unveiling the significance of intrinsic sensitivity and multiple scattering in speckle metrology",

abstract = "Speckle patterns are a powerful tool for high-precision metrology, as they allow remarkable performance in relatively simple setups. Nonetheless, researchers in this field follow rather distinct paths due to underappreciated general principles underlying speckle phenomena. Here, we advise on a universal metric of intrinsic speckle sensitivity, and on the advantages and disadvantages of multiple scattering. This will catalyse progress in speckle metrology but will also translate to other domains of disordered optics which are undergoing rapid developments at present.",

author = "Morgan Facchin and Khan, {Saba N.} and Kishan Dholakia and Bruce, {Graham D.}",

note = "Funding: This work was supported by funding from the Leverhulme Trust (RPG-2017-197), the UK Engineering and Physical Sciences Research Council (EP/P030017/1, EP/R004854/1), and the Australian Research Council (FL210100099).",

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AU - Facchin, Morgan

AU - Khan, Saba N.

AU - Dholakia, Kishan

AU - Bruce, Graham D.

N1 - Funding: This work was supported by funding from the Leverhulme Trust (RPG-2017-197), the UK Engineering and Physical Sciences Research Council (EP/P030017/1, EP/R004854/1), and the Australian Research Council (FL210100099).

PY - 2024/3/28

Y1 - 2024/3/28

N2 - Speckle patterns are a powerful tool for high-precision metrology, as they allow remarkable performance in relatively simple setups. Nonetheless, researchers in this field follow rather distinct paths due to underappreciated general principles underlying speckle phenomena. Here, we advise on a universal metric of intrinsic speckle sensitivity, and on the advantages and disadvantages of multiple scattering. This will catalyse progress in speckle metrology but will also translate to other domains of disordered optics which are undergoing rapid developments at present.

AB - Speckle patterns are a powerful tool for high-precision metrology, as they allow remarkable performance in relatively simple setups. Nonetheless, researchers in this field follow rather distinct paths due to underappreciated general principles underlying speckle phenomena. Here, we advise on a universal metric of intrinsic speckle sensitivity, and on the advantages and disadvantages of multiple scattering. This will catalyse progress in speckle metrology but will also translate to other domains of disordered optics which are undergoing rapid developments at present.

M3 - Preprint

BT - Unveiling the significance of intrinsic sensitivity and multiple scattering in speckle metrology

PB - arXiv

ER -

Unveiling the significance of intrinsic sensitivity and multiple scattering in speckle metrology

Abstract

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Projects

M Squared - USTAN Biophotonics Nexus: M Sqaured - St Andrews Biophotonics Nexus

Making the most of interference: Making the most of interference: new metrology application of laser speckle

Resonant and shaped photonics for under: Resonant and shaped photonics for understanding the physical and biomedical world

Datasets

Data underpinning "Determining intrinsic sensitivity and the role of multiple scattering in speckle metrology"

Cite this