Abstract
Electron accumulation is found to occur at the surface of wurtzite ( 11 (2) over bar0), (0001) , and (000 (1) over bar) and zinc-blende (001) InN using x-ray photoemission spectroscopy. The accumulation is shown to be a universal feature of InN surfaces. This is due to the low Gamma-point conduction band minimum lying significantly below the charge neutrality level. (c) 2007 American Institute of Physics.
| Original language | English |
|---|---|
| Pages (from-to) | 092101 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 91 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 27 Aug 2007 |
Keywords
- MOLECULAR-BEAM EPITAXY
- BAND OFFSETS
- GROWTH
- LAYERS
- INVERSION
- GAN
Fingerprint
Dive into the research topics of 'Universality of electron accumulation at wurtzite c- and a-plane and zinc-blende InN surfaces'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver