Abstract
A pedagogical essay is given that alerts researchers to the errors inherent in assigning linear I(V) current-voltage dependences to Ohmic conduction. Such a linear I(V) is necessary but not sufficient, since other mechanisms, including Simmons' modification of the basic Schottky emission theory, also give linear I(V) at small applied voltages. Discrimination among Ohmic, Schottky, space-charge limited, and other models requires accurate thickness dependence I(d) data, where for Ohmic conduction I = a/d, whereas for interface-limited mechanisms such as Simmons/Schottky, I is nearly independent of d.
Original language | English |
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Article number | 142202 |
Number of pages | 4 |
Journal | Journal of Physics: Condensed Matter |
Volume | 26 |
Issue number | 14 |
DOIs | |
Publication status | Published - 9 Apr 2014 |
Keywords
- ferroelectrics
- thin films
- dielectrics
- conduction
- LEAKAGE CURRENT
- LIMITED CURRENT
- MEMORIES
- MECHANISM
- ELECTRODES
- CAPACITORS
- CURRENTS
- BIFEO3