TY - JOUR
T1 - The role of crystallinity of the Nb2O5 blocking layer on the performance of dye-sensitized solar cells
AU - Suresh, Sankarapanicker
AU - Deepak, Thrithamarassery Gangadharan
AU - Ni, Chengsheng
AU - Sreekala, Chandrasekharan Nair Omanaamma
AU - Satyanarayana, Malladi
AU - Nair, A. Sreekumaran
AU - Pillai, Vellara Pappukkuty Pillai Mahadevan
N1 - Mr S. Suresh thanks the University Grants Commission, New Delhi, India for granting the teacher fellowship through the faculty development programme. T. G. Deepak, C. O. Sreekala and A. S. Nair thank the Ministry of New and Renewable Energy (MNRE) for financial support.
PY - 2016/7/1
Y1 - 2016/7/1
N2 - The prevention of back electron transfer by inserting an energy barrier layer at the interface of a photo-anode is an effective method for improving the photovoltaic parameters in dye sensitised solar cells (DSSCs). In this study, phase a modified Nb2O5 blocking layer was inserted at the fluorine doped tin oxide (FTO)/TiO2 interface via a Rf magnetron sputtering process. For a critical tunnelling distance of -40 nm, the crystalline Nb2O5 blocking layer improved the efficiency close to 7% and outperformed the amorphous blocking layer by about 68%. The longer electron lifetime observed in DSSCs containing an inhomogeneous Nb2O5 layer indicates that trapping/de-trapping impedes the discharge of electrons to the TiO2 band edge. The origin of the longer electron lifetime is explained by formulating a theory from photovoltage decay measurements.
AB - The prevention of back electron transfer by inserting an energy barrier layer at the interface of a photo-anode is an effective method for improving the photovoltaic parameters in dye sensitised solar cells (DSSCs). In this study, phase a modified Nb2O5 blocking layer was inserted at the fluorine doped tin oxide (FTO)/TiO2 interface via a Rf magnetron sputtering process. For a critical tunnelling distance of -40 nm, the crystalline Nb2O5 blocking layer improved the efficiency close to 7% and outperformed the amorphous blocking layer by about 68%. The longer electron lifetime observed in DSSCs containing an inhomogeneous Nb2O5 layer indicates that trapping/de-trapping impedes the discharge of electrons to the TiO2 band edge. The origin of the longer electron lifetime is explained by formulating a theory from photovoltage decay measurements.
U2 - 10.1039/C6NJ01133K
DO - 10.1039/C6NJ01133K
M3 - Article
SN - 1144-0546
VL - 40
SP - 6228
EP - 6237
JO - New Journal of Chemistry
JF - New Journal of Chemistry
IS - 7
ER -