Abstract
The luminescence emission of quartz is used in optically stimulated luminescence dating (OSL), however the precise origins of the emission are unclear. A suite of quartz samples were analysed using X-ray excited optical luminescence (XEOL). Radiation dose effects were observed whereby the UV emissions (3.8 and 3.4 eV) were depleted to the benefit of the red emission (1.9-2.0 eV). Samples were excited at similar to 7 keV. Understanding why some quartz emit light more brightly than others will increase the efficiency and precision of OSL analyses. (C) 2011 Elsevier Ltd. All rights reserved.
| Original language | English |
|---|---|
| Pages (from-to) | 1082-1089 |
| Number of pages | 8 |
| Journal | Radiation Measurements |
| Volume | 46 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - Oct 2011 |
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