The problem of dating quartz 2: Synchrotron generated X-ray excited optical luminescence (XEOL) from quartz

G. E. King, A. A. Finch, R. A. J. Robinson, R. P. Taylor, J. F. W. Mosselmans

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

The luminescence emission of quartz is used in optically stimulated luminescence dating (OSL), however the precise origins of the emission are unclear. A suite of quartz samples were analysed using X-ray excited optical luminescence (XEOL). Radiation dose effects were observed whereby the UV emissions (3.8 and 3.4 eV) were depleted to the benefit of the red emission (1.9-2.0 eV). Samples were excited at similar to 7 keV. Understanding why some quartz emit light more brightly than others will increase the efficiency and precision of OSL analyses. (C) 2011 Elsevier Ltd. All rights reserved.

Original languageEnglish
Pages (from-to)1082-1089
Number of pages8
JournalRadiation Measurements
Volume46
Issue number10
DOIs
Publication statusPublished - Oct 2011

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