The problem of dating quartz 2: Synchrotron generated X-ray excited optical luminescence (XEOL) from quartz

G. E. King; A. A. Finch; R. A. J. Robinson; R. P. Taylor; J. F. W. Mosselmans

doi:10.1016/j.radmeas.2011.08.014

The problem of dating quartz 2: Synchrotron generated X-ray excited optical luminescence (XEOL) from quartz

G. E. King, A. A. Finch, R. A. J. Robinson, R. P. Taylor, J. F. W. Mosselmans

Research output: Contribution to journal › Article › peer-review

Abstract

The luminescence emission of quartz is used in optically stimulated luminescence dating (OSL), however the precise origins of the emission are unclear. A suite of quartz samples were analysed using X-ray excited optical luminescence (XEOL). Radiation dose effects were observed whereby the UV emissions (3.8 and 3.4 eV) were depleted to the benefit of the red emission (1.9-2.0 eV). Samples were excited at similar to 7 keV. Understanding why some quartz emit light more brightly than others will increase the efficiency and precision of OSL analyses. (C) 2011 Elsevier Ltd. All rights reserved.

Original language	English
Pages (from-to)	1082-1089
Number of pages	8
Journal	Radiation Measurements
Volume	46
Issue number	10
DOIs	https://doi.org/10.1016/j.radmeas.2011.08.014
Publication status	Published - Oct 2011

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10.1016/j.radmeas.2011.08.014

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title = "The problem of dating quartz 2: Synchrotron generated X-ray excited optical luminescence (XEOL) from quartz",

abstract = "The luminescence emission of quartz is used in optically stimulated luminescence dating (OSL), however the precise origins of the emission are unclear. A suite of quartz samples were analysed using X-ray excited optical luminescence (XEOL). Radiation dose effects were observed whereby the UV emissions (3.8 and 3.4 eV) were depleted to the benefit of the red emission (1.9-2.0 eV). Samples were excited at similar to 7 keV. Understanding why some quartz emit light more brightly than others will increase the efficiency and precision of OSL analyses. (C) 2011 Elsevier Ltd. All rights reserved.",

author = "King, {G. E.} and Finch, {A. A.} and Robinson, {R. A. J.} and Taylor, {R. P.} and Mosselmans, {J. F. W.}",

year = "2011",

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doi = "10.1016/j.radmeas.2011.08.014",

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journal = "Radiation Measurements",

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T1 - The problem of dating quartz 2: Synchrotron generated X-ray excited optical luminescence (XEOL) from quartz

AU - King, G. E.

AU - Finch, A. A.

AU - Robinson, R. A. J.

AU - Taylor, R. P.

AU - Mosselmans, J. F. W.

PY - 2011/10

Y1 - 2011/10

N2 - The luminescence emission of quartz is used in optically stimulated luminescence dating (OSL), however the precise origins of the emission are unclear. A suite of quartz samples were analysed using X-ray excited optical luminescence (XEOL). Radiation dose effects were observed whereby the UV emissions (3.8 and 3.4 eV) were depleted to the benefit of the red emission (1.9-2.0 eV). Samples were excited at similar to 7 keV. Understanding why some quartz emit light more brightly than others will increase the efficiency and precision of OSL analyses. (C) 2011 Elsevier Ltd. All rights reserved.

AB - The luminescence emission of quartz is used in optically stimulated luminescence dating (OSL), however the precise origins of the emission are unclear. A suite of quartz samples were analysed using X-ray excited optical luminescence (XEOL). Radiation dose effects were observed whereby the UV emissions (3.8 and 3.4 eV) were depleted to the benefit of the red emission (1.9-2.0 eV). Samples were excited at similar to 7 keV. Understanding why some quartz emit light more brightly than others will increase the efficiency and precision of OSL analyses. (C) 2011 Elsevier Ltd. All rights reserved.

U2 - 10.1016/j.radmeas.2011.08.014

DO - 10.1016/j.radmeas.2011.08.014

M3 - Article

SN - 1350-4487

VL - 46

SP - 1082

EP - 1089

JO - Radiation Measurements

JF - Radiation Measurements

IS - 10

ER -

The problem of dating quartz 2: Synchrotron generated X-ray excited optical luminescence (XEOL) from quartz

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