The location of sorbed Kr in silicalite using resonant X-ray diffraction

R. H. Jones*, P. Lightfoot, R. M. Ormerod

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

The location of sorbed Kr atoms in the zeolite silicalite has been determined by the joint Rietveld refinement of off-edge and on-edge (Kr K-edge) data. Three sites have been determined for the Kr atoms, these being in the sinusoidal channel, the straight channel and at the intersection of these two channels. These sites are in good agreement with previous theoretical studies. There is no reduction in crystal symmetry upon sorption of the Kr; space group Pnma, a = 20.034(1) A ̊, b = 19.835(1) A ̊, c = 13.3569(9) A ̊.

Original languageEnglish
Pages (from-to)1377-1381
Number of pages5
JournalJournal of Physics and Chemistry of Solids
Volume56
Issue number10
DOIs
Publication statusPublished - 1 Jan 1995

Keywords

  • A. microporous materials
  • C. X-ray diffraction
  • D. crystal structure

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