TY - JOUR
T1 - The location of sorbed Kr in silicalite using resonant X-ray diffraction
AU - Jones, R. H.
AU - Lightfoot, P.
AU - Ormerod, R. M.
PY - 1995/1/1
Y1 - 1995/1/1
N2 - The location of sorbed Kr atoms in the zeolite silicalite has been determined by the joint Rietveld refinement of off-edge and on-edge (Kr K-edge) data. Three sites have been determined for the Kr atoms, these being in the sinusoidal channel, the straight channel and at the intersection of these two channels. These sites are in good agreement with previous theoretical studies. There is no reduction in crystal symmetry upon sorption of the Kr; space group Pnma, a = 20.034(1) A ̊, b = 19.835(1) A ̊, c = 13.3569(9) A ̊.
AB - The location of sorbed Kr atoms in the zeolite silicalite has been determined by the joint Rietveld refinement of off-edge and on-edge (Kr K-edge) data. Three sites have been determined for the Kr atoms, these being in the sinusoidal channel, the straight channel and at the intersection of these two channels. These sites are in good agreement with previous theoretical studies. There is no reduction in crystal symmetry upon sorption of the Kr; space group Pnma, a = 20.034(1) A ̊, b = 19.835(1) A ̊, c = 13.3569(9) A ̊.
KW - A. microporous materials
KW - C. X-ray diffraction
KW - D. crystal structure
UR - http://www.scopus.com/inward/record.url?scp=0000632310&partnerID=8YFLogxK
U2 - 10.1016/0022-3697(95)00073-9
DO - 10.1016/0022-3697(95)00073-9
M3 - Article
AN - SCOPUS:0000632310
SN - 0022-3697
VL - 56
SP - 1377
EP - 1381
JO - Journal of Physics and Chemistry of Solids
JF - Journal of Physics and Chemistry of Solids
IS - 10
ER -