Abstract
The structure determination of as-made silica zeolites CHA and FER prepared in the presence of fluoride ions has been accomplished using microcrystal X-ray diffraction at a synchrotron source. In both cases, the location of the fluoride ions has been determined. Fluoride ions are incorporated into small double six-ring cages in the CHA framework, and the organic guests have been located in the larger chabazite cages. In contrast to two previous single-crystal X-ray diffraction studies of as-made siliceous FER prepared in related ways fluoride ions are incorporated into the framework and are found occluded inside small cages in the structure.
| Original language | English |
|---|---|
| Pages (from-to) | 1978-1982 |
| Number of pages | 5 |
| Journal | Journal of Materials Chemistry |
| Volume | 13 |
| DOIs | |
| Publication status | Published - 2003 |
Keywords
- X-RAY-DIFFRACTION
- SOLID-STATE NMR
- SI-29 MAS-NMR
- 5-COORDINATE SILICON
- MOLECULAR-SIEVES
- BETA-ZEOLITE
- FERRIERITE
- FRAMEWORK
- TEMPLATE
- IONS
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