The ExoMars Spectral Tool (ExoSpec): an image analysis tool for ExoMars 2020 PanCam imagery

Elyse Allender, Roger Stabbins, Matthew Gunn, Claire R. Cousins, Andrew Coates

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The upcoming launch of the European Space Agency (ESA) ExoMars 2020 rover signals a need for an analysis tool to be created which can exploit the multi- and hyperspectral data that will be returned by its Panoramic Camera (PanCam), Infrared Spectrometer for Mars (ISEM), and Close-UP Imager (CLUPI) instruments. Data processed by this analysis tool will be invaluable in (i) characterising the geology local to the ExoMars rover, (ii) relating ground-based observations to orbital Compact Reconnaissance Imaging Spectrometer for Mars (CRISM) data, (iii) detecting evidence of past habitability on Mars, and (iv) identifying drilling locations. PanCam, ISEM, and CLUPI offer spectral analysis capabilities in both spatial (140-1310 microns/pixel at 2 m working distance) and spectral (440-3300 nm) dimensions. We have developed the ExoMars Spectral Tool (ExoSpec) which functions as a GUI-based extension to ENVI + IDL and performs steps from image import and compilation into ENVI .dat format, flat-fielding, radiometric correction, radiance-toreflectance (R*) corrections using the in-scene Gretag MacBeth ColorCheckerTM, and calculation of spectral parameters. We demonstrate the functionality of ExoSpec at its current stage of development and illustrate its utility with results from field expeditions to Mars analogue terrains in: (i) geothermally altered basalts in N´amafjall, Iceland, and (ii) layered alluvial plains deposits in Hanksville, USA, using ExoMars PanCam, ISEM, and CLUPI emulator instruments.
Original languageEnglish
Title of host publicationImage and Signal Processing for Remote Sensing XXIV
EditorsLorenzo Bruzzone, Francesca Bovolo
Number of pages19
ISBN (Electronic)9781510621626
DOIs
Publication statusPublished - 9 Oct 2018
EventSPIE remote sensing - Berlin, Germany
Duration: 10 Sept 201813 Sept 2018

Publication series

NameProceedings of SPIE
PublisherSociety of Photo-optical Instrumentation Engineers
Volume10789
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceSPIE remote sensing
Country/TerritoryGermany
CityBerlin
Period10/09/1813/09/18

Keywords

  • European Space Agency
  • ESA
  • ExoMars
  • PanCam
  • ENVI IDL
  • Spectral
  • Processing

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