Test structures for characterising the integration of EWOD and SAW technologies for microfluidics

Y. Li*, Y. Q. Fu, B. W. Flynn, W. Parkes, Y. Liu, S. Brodie, J. G. Terry, L. I. Haworth, A. S. Bunting, J. T.M. Stevenson, S. Smith, A. J. Walton

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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