@inproceedings{86d563089c1c4ba4a6d144f974035290,
title = "Temporary grating coupler structures using localised refractive index engineering",
abstract = "We demonstrate an erasable grating coupler which allows optical device testing throughout the fabrication process without impairing final circuit performance. Refractive index variation is introduced using ion implantation and can be subsequently removed using laser annealing.",
keywords = "Ion implantation, Photonics, Circuit performance, Fabrication process, Grating couplers, Laser annealing, Localised, Optical device testing, Refractive index variations, Temporary gratings",
author = "R. Topley and G. Martinez-Jimenez and L. O'Faolain and N. Healy and S. Mailis and D.J. Thomson and F.Y. Gardes and A.C. Peacock and D.N.R. Payne and G.Z. Mashanovich and G.T. Reed",
year = "2014",
doi = "10.1364/ACPC.2014.AW3B.2",
language = "English",
series = "Asia Communications and Photonics Conference",
publisher = "Optical Society of American (OSA)",
booktitle = "Asia Communications and Photonics Conference, ACP 2014",
address = "United States",
note = "Asia Communications and Photonics Conference ; Conference date: 11-11-2014 Through 14-11-2014",
}