Temporary grating coupler structures using localised refractive index engineering

R. Topley, G. Martinez-Jimenez, L. O'Faolain, N. Healy, S. Mailis, D.J. Thomson, F.Y. Gardes, A.C. Peacock, D.N.R. Payne, G.Z. Mashanovich, G.T. Reed

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We demonstrate an erasable grating coupler which allows optical device testing throughout the fabrication process without impairing final circuit performance. Refractive index variation is introduced using ion implantation and can be subsequently removed using laser annealing.
Original languageEnglish
Title of host publicationAsia Communications and Photonics Conference, ACP 2014
PublisherOptical Society of American (OSA)
Publication statusPublished - 2014
EventAsia Communications and Photonics Conference - Shanghai International Convention Center, Shanghai, China
Duration: 11 Nov 201414 Nov 2014

Publication series

NameAsia Communications and Photonics Conference
PublisherOptical Society of America (OSA)
ISSN (Print)2162-108X


ConferenceAsia Communications and Photonics Conference


  • Ion implantation
  • Photonics
  • Circuit performance
  • Fabrication process
  • Grating couplers
  • Laser annealing
  • Localised
  • Optical device testing
  • Refractive index variations
  • Temporary gratings


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