Abstract
The variation in surface electronic properties of undoped c-plane InxAl1-xN alloys has been investigated across the composition range using a combination of high-resolution x-ray photoemission spectroscopy and single-field Hall effect measurements. For the In-rich alloys, electron accumulation layers, accompanied by a downward band bending, are present at the surface, with a decrease to approximately flatband conditions with increasing Al composition. However, for the Al-rich alloys, the undoped samples were found to be insulating with approximate midgap pinning of the surface Fermi level observed. (C) 2008 American Institute of Physics.
| Original language | English |
|---|---|
| Pages (from-to) | 172105 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 92 |
| Issue number | 17 |
| DOIs | |
| Publication status | Published - 28 Apr 2008 |
Keywords
- BAND OFFSETS
- ACCUMULATION
- INN
- INTERFACE
- LAYERS
- GAP