Abstract
X-ray photoemission spectroscopy is utilised to determine the variation in surface Fermi level pinning across the composition range of n- and p-type c-plane InxGa1-xN alloys. The pinning relative to the charge neutrality level is used to explain a change in band bending direction causing a transition from surface electron accumulation (In rich) to depletion (Ga-rich), at x approximate to 0.43 for n-type alloys and a transition from surface inversion to hole depletion at x approximate to 0.59 for p-type alloys where downward band bending occurs across the composition range. (C) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Original language | English |
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Pages (from-to) | 881-883 |
Number of pages | 3 |
Journal | Physica Status Solidi. B |
Volume | 245 |
Issue number | 5 |
DOIs | |
Publication status | Published - May 2008 |
Keywords
- MOLECULAR-BEAM EPITAXY
- ACCUMULATION
- INN