Skip to main navigation Skip to search Skip to main content

Submicron three-dimensional trenched electrodes and capacitors for DRAMs and FRAMs: Fabrication and electrical testing

M. Miyake, J. F. Scott, X. J. Lou, F. D. Morrison, T. Nonaka, S. Motoyama, T. Tatsuta, O. Tsuji

Research output: Contribution to journalArticlepeer-review

Search results