Structural characterization of shock-affected sapphire

M. Mazilu, S. Juodkazis, T. Ebisui, S. Matsuo, H. Misawa

Research output: Contribution to journalArticlepeer-review

27 Citations (Scopus)


The presence of dislocations has been revealed by numerical processing of high-resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 mu m depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of similar or equal to 8 x 10(12) cm(-2).

Original languageEnglish
Pages (from-to)197-200
Number of pages4
JournalApplied Physics A
Issue number2
Publication statusPublished - Feb 2007




Dive into the research topics of 'Structural characterization of shock-affected sapphire'. Together they form a unique fingerprint.

Cite this