Structural characterization of shock-affected sapphire

M. Mazilu; S. Juodkazis; T. Ebisui; S. Matsuo; H. Misawa

doi:10.1007/s00339-006-3732-8

Structural characterization of shock-affected sapphire

M. Mazilu, S. Juodkazis, T. Ebisui, S. Matsuo, H. Misawa

Research output: Contribution to journal › Article › peer-review

Abstract

The presence of dislocations has been revealed by numerical processing of high-resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 mu m depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of similar or equal to 8 x 10(12) cm(-2).

Original language	English
Pages (from-to)	197-200
Number of pages	4
Journal	Applied Physics A
Volume	86
Issue number	2
DOIs	https://doi.org/10.1007/s00339-006-3732-8
Publication status	Published - Feb 2007

Keywords

FEMTOSECOND
GLASS

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@article{800a9c7ad8a54b9f9670704863aee09e,

title = "Structural characterization of shock-affected sapphire",

abstract = "The presence of dislocations has been revealed by numerical processing of high-resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 mu m depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of similar or equal to 8 x 10(12) cm(-2).",

keywords = "FEMTOSECOND, GLASS",

author = "M. Mazilu and S. Juodkazis and T. Ebisui and S. Matsuo and H. Misawa",

year = "2007",

month = feb,

doi = "10.1007/s00339-006-3732-8",

language = "English",

volume = "86",

pages = "197--200",

journal = "Applied Physics A",

issn = "0947-8396",

publisher = "Springer",

number = "2",

}

TY - JOUR

T1 - Structural characterization of shock-affected sapphire

AU - Mazilu, M.

AU - Juodkazis, S.

AU - Ebisui, T.

AU - Matsuo, S.

AU - Misawa, H.

PY - 2007/2

Y1 - 2007/2

N2 - The presence of dislocations has been revealed by numerical processing of high-resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 mu m depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of similar or equal to 8 x 10(12) cm(-2).

AB - The presence of dislocations has been revealed by numerical processing of high-resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 mu m depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of similar or equal to 8 x 10(12) cm(-2).

KW - FEMTOSECOND

KW - GLASS

UR - http://www.scopus.com/inward/record.url?scp=33845330283&partnerID=8YFLogxK

U2 - 10.1007/s00339-006-3732-8

DO - 10.1007/s00339-006-3732-8

M3 - Article

SN - 0947-8396

VL - 86

SP - 197

EP - 200

JO - Applied Physics A

JF - Applied Physics A

IS - 2

ER -

Structural characterization of shock-affected sapphire

Abstract

Keywords

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