Spitzer microlens measurement of a massive remnant in a well-separated binary

Y. Shvartzvald, A. Udalski, A. Gould, C. Han, V. Bozza, M. Friedmann, Markus Peter Gerhard Hundertmark, C. Beichman, G. Bryden, S. Calchi Novati, S. Carey, M. Fausnaugh, B. S. Gaudi, C. B. Henderson, T. Kerr, R. W. Pogge, W. Varricatt, B. Wibking, J. C. Yee, W. ZhuR. Poleski, M. Pawlak, M. K. Szymański, J. Skowron, P. Mróz, S. Kozłowski, Ł. Wyrzykowski, P. Pietrukowicz, G. Pietrzyński, I. Soszyński, K. Ulaczyk, J.-Y. Choi, H. Park, Y. K. Jung, I.-G. Shin, M. D. Albrow, B.-G. Park, S.-L. Kim, C.-U. Lee, S.-M. Cha, D.-J. Kim, Y. Lee, D. Maoz, S. Kaspi, R. A. Street, Y. Tsapras, E. Bachelet, Martin Dominik, D. M. Bramich, Keith Douglas Horne, C. Snodgrass, I. A. Steele, J. Menzies, Roberto Jose Figuera Jaimes, J. Wambsganss, R. Schmidt, A. Cassan, C. Ranc, S. Mao, Subo Dong, G. D’Ago, G. Scarpetta, P. Verma, U. G. Jørgensen, E. Kerins, J. Skottfelt

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