Spin Lifetimes in Quantum Dots from Noise Measurements

J. Wabnig*, B. W. Lovett, J. H. Jefferson, G. A. D. Briggs

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

We present a method of obtaining information about spin lifetimes in quantum dots from measurements of electrical transport. The dot is under resonant microwave irradiation and at temperatures comparable to or larger than the Zeeman energy. We find that the ratio of the spin coherence times T(1)/T(2) can be deduced from a measurement of current through the quantum dot as a function the applied magnetic field. We calculate the noise power spectrum of the dot current and show that a dip occurs at the Rabi frequency with a linewidth given by 1/T(1)+1/T(2).

Original languageEnglish
Article number016802
Number of pages4
JournalPhysical Review Letters
Volume102
Issue number1
DOIs
Publication statusPublished - 9 Jan 2009

Fingerprint

Dive into the research topics of 'Spin Lifetimes in Quantum Dots from Noise Measurements'. Together they form a unique fingerprint.

Cite this