Spectroscopic ellipsometry measurements on an anisotropic organic crystal: potassium acid phthalate

A  Sassella; R  Tubino; A  Borghesi; M E  Giardini; L  Quadrelli

doi:10.1016/S0040-6090(97)00844-4

Spectroscopic ellipsometry measurements on an anisotropic organic crystal: potassium acid phthalate

A Sassella, R Tubino, A Borghesi, M E Giardini, L Quadrelli

School of Medicine

Research output: Contribution to journal › Article › peer-review

Abstract

Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly oriented polymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis. (C) 1998 Elsevier Science S.A.

Original language	English
Pages (from-to)	347-350
Number of pages	4
Journal	Thin Solid Films
Volume	313-314
DOIs	https://doi.org/10.1016/S0040-6090(97)00844-4
Publication status	Published - 13 Feb 1998

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title = "Spectroscopic ellipsometry measurements on an anisotropic organic crystal: potassium acid phthalate",

abstract = "Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly oriented polymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis. (C) 1998 Elsevier Science S.A.",

author = "A Sassella and R Tubino and A Borghesi and Giardini, {M E} and L Quadrelli",

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AU - Sassella, A

AU - Tubino, R

AU - Borghesi, A

AU - Giardini, M E

AU - Quadrelli, L

PY - 1998/2/13

Y1 - 1998/2/13

N2 - Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly oriented polymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis. (C) 1998 Elsevier Science S.A.

AB - Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly oriented polymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis. (C) 1998 Elsevier Science S.A.

U2 - 10.1016/S0040-6090(97)00844-4

DO - 10.1016/S0040-6090(97)00844-4

M3 - Article

SN - 0040-6090

VL - 313-314

SP - 347

EP - 350

JO - Thin Solid Films

JF - Thin Solid Films

ER -

Spectroscopic ellipsometry measurements on an anisotropic organic crystal: potassium acid phthalate

Abstract

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