Solid state NMR studies of the fluoride containing zeolite SSZ-44

RJ Darton; DH Brouwer; CA Fyfe; LA Villaescusa; Russell Edward Morris

doi:10.1021/cm034976x

Solid state NMR studies of the fluoride containing zeolite SSZ-44

RJ Darton, DH Brouwer, CA Fyfe, LA Villaescusa, Russell Edward Morris

Research output: Contribution to journal › Article › peer-review

22 Citations (Scopus)

Abstract

Magic-angle spinning NMR has been used to probe the local structure of as-made zeolite SFF containing occluded fluoride and NN-diethyl-2,6-dimethylpiperidinium. The Si-F bond distance has been measured using two methods: variable contact time cross polarization studies (1.74 Angstrom) and spinning sideband intensity fitting at relatively slow spinning speeds (1.79 Angstrom). Both measurements yield results that are significantly shorter than the internuclear Si-F distance as measured by single-crystal X-ray diffraction (similar to1.9 Angstrom), which is based on the average positions of the atoms due to disorder and hence does not reflect the true bond distance.

Original language	English
Pages (from-to)	600-603
Number of pages	4
Journal	Chemistry of Materials
Volume	16
DOIs	https://doi.org/10.1021/cm034976x
Publication status	Published - 24 Feb 2004

Keywords

5-COORDINATE SILICON
MOLECULAR-SIEVES
MEDIA
SPECTROSCOPY
LOCATION
TEMPLATE
COMPLEX
IONS
STF
IFR

Access to Document

10.1021/cm034976x

Cite this

@article{138e58ad04c94c8fb722876fa6c9ec6a,

title = "Solid state NMR studies of the fluoride containing zeolite SSZ-44",

abstract = "Magic-angle spinning NMR has been used to probe the local structure of as-made zeolite SFF containing occluded fluoride and NN-diethyl-2,6-dimethylpiperidinium. The Si-F bond distance has been measured using two methods: variable contact time cross polarization studies (1.74 Angstrom) and spinning sideband intensity fitting at relatively slow spinning speeds (1.79 Angstrom). Both measurements yield results that are significantly shorter than the internuclear Si-F distance as measured by single-crystal X-ray diffraction (similar to1.9 Angstrom), which is based on the average positions of the atoms due to disorder and hence does not reflect the true bond distance.",

keywords = "5-COORDINATE SILICON, MOLECULAR-SIEVES, MEDIA, SPECTROSCOPY, LOCATION, TEMPLATE, COMPLEX, IONS, STF, IFR",

author = "RJ Darton and DH Brouwer and CA Fyfe and LA Villaescusa and Morris, {Russell Edward}",

year = "2004",

month = feb,

day = "24",

doi = "10.1021/cm034976x",

language = "English",

volume = "16",

pages = "600--603",

journal = "Chemistry of Materials",

issn = "0897-4756",

publisher = "American Chemical Society (ACS)",

}

TY - JOUR

T1 - Solid state NMR studies of the fluoride containing zeolite SSZ-44

AU - Darton, RJ

AU - Brouwer, DH

AU - Fyfe, CA

AU - Villaescusa, LA

AU - Morris, Russell Edward

PY - 2004/2/24

Y1 - 2004/2/24

N2 - Magic-angle spinning NMR has been used to probe the local structure of as-made zeolite SFF containing occluded fluoride and NN-diethyl-2,6-dimethylpiperidinium. The Si-F bond distance has been measured using two methods: variable contact time cross polarization studies (1.74 Angstrom) and spinning sideband intensity fitting at relatively slow spinning speeds (1.79 Angstrom). Both measurements yield results that are significantly shorter than the internuclear Si-F distance as measured by single-crystal X-ray diffraction (similar to1.9 Angstrom), which is based on the average positions of the atoms due to disorder and hence does not reflect the true bond distance.

AB - Magic-angle spinning NMR has been used to probe the local structure of as-made zeolite SFF containing occluded fluoride and NN-diethyl-2,6-dimethylpiperidinium. The Si-F bond distance has been measured using two methods: variable contact time cross polarization studies (1.74 Angstrom) and spinning sideband intensity fitting at relatively slow spinning speeds (1.79 Angstrom). Both measurements yield results that are significantly shorter than the internuclear Si-F distance as measured by single-crystal X-ray diffraction (similar to1.9 Angstrom), which is based on the average positions of the atoms due to disorder and hence does not reflect the true bond distance.

KW - 5-COORDINATE SILICON

KW - MOLECULAR-SIEVES

KW - MEDIA

KW - SPECTROSCOPY

KW - LOCATION

KW - TEMPLATE

KW - COMPLEX

KW - IONS

KW - STF

KW - IFR

UR - http://www.scopus.com/inward/record.url?scp=1242297715&partnerID=8YFLogxK

U2 - 10.1021/cm034976x

DO - 10.1021/cm034976x

M3 - Article

SN - 0897-4756

VL - 16

SP - 600

EP - 603

JO - Chemistry of Materials

JF - Chemistry of Materials

ER -

Solid state NMR studies of the fluoride containing zeolite SSZ-44

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this