Size-dependent reversal of grains in perpendicular magnetic recording media measured by small-angle polarized neutron scattering

Stephen Joseph Shelford Lister; T. Thomson; J.  Kohlbrecher; K. Takano; Vikash Venkataramana; Soumya Jyoti Ray; Matthew Peter Wismayer; M.A. de Vries; H. Do; Y. Ikeda; Stephen Leslie Lee

doi:10.1063/1.3486680

Size-dependent reversal of grains in perpendicular magnetic recording media measured by small-angle polarized neutron scattering

Stephen Joseph Shelford Lister, T. Thomson, J. Kohlbrecher, K. Takano, Vikash Venkataramana, Soumya Jyoti Ray, Matthew Peter Wismayer, M.A. de Vries, H. Do, Y. Ikeda, Stephen Leslie Lee

Research output: Contribution to journal › Article › peer-review

Abstract

Polarized small-angle neutron scattering has been used to measure the magnetic structure of a CoCrPt–SiOx thin-film data storage layer, contained within a writable perpendicular recording media, at granular (<10 nm) length scales. The magnetic contribution to the scattering is measured as the magnetization is reversed by an external field, providing unique spatial information on the switching process. A simple model of noninteracting nanomagnetic grains provides a good description of the data and an analysis of the grain-size dependent reversal provides strong evidence for an increase in magnetic anisotropy with grain diameter.

Original language	English
Article number	112503
Journal	Applied Physics Letters
Volume	97
Issue number	11
DOIs	https://doi.org/10.1063/1.3486680
Publication status	Published - 2010

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10.1063/1.3486680

Advanced Characterisation of Magnetic: Advanced Characterisation of Magnetic Recording Media using Neutron Scattering
Lee, S. (PI)
EPSRC
1/11/07 → 31/03/11
Project: Standard

Cite this

Lister, S. J. S., Thomson, T., Kohlbrecher, J., Takano, K., Venkataramana, V., Ray, S. J., Wismayer, M. P., de Vries, M. A., Do, H., Ikeda, Y., & Lee, S. L. (2010). Size-dependent reversal of grains in perpendicular magnetic recording media measured by small-angle polarized neutron scattering. Applied Physics Letters, 97(11), Article 112503. https://doi.org/10.1063/1.3486680

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title = "Size-dependent reversal of grains in perpendicular magnetic recording media measured by small-angle polarized neutron scattering",

abstract = "Polarized small-angle neutron scattering has been used to measure the magnetic structure of a CoCrPt–SiOx thin-film data storage layer, contained within a writable perpendicular recording media, at granular (<10 nm) length scales. The magnetic contribution to the scattering is measured as the magnetization is reversed by an external field, providing unique spatial information on the switching process. A simple model of noninteracting nanomagnetic grains provides a good description of the data and an analysis of the grain-size dependent reversal provides strong evidence for an increase in magnetic anisotropy with grain diameter.",

author = "Lister, {Stephen Joseph Shelford} and T. Thomson and J. Kohlbrecher and K. Takano and Vikash Venkataramana and Ray, {Soumya Jyoti} and Wismayer, {Matthew Peter} and {de Vries}, M.A. and H. Do and Y. Ikeda and Lee, {Stephen Leslie}",

year = "2010",

doi = "10.1063/1.3486680",

language = "English",

volume = "97",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

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T1 - Size-dependent reversal of grains in perpendicular magnetic recording media measured by small-angle polarized neutron scattering

AU - Lister, Stephen Joseph Shelford

AU - Thomson, T.

AU - Kohlbrecher, J.

AU - Takano, K.

AU - Venkataramana, Vikash

AU - Ray, Soumya Jyoti

AU - Wismayer, Matthew Peter

AU - de Vries, M.A.

AU - Do, H.

AU - Ikeda, Y.

AU - Lee, Stephen Leslie

PY - 2010

Y1 - 2010

N2 - Polarized small-angle neutron scattering has been used to measure the magnetic structure of a CoCrPt–SiOx thin-film data storage layer, contained within a writable perpendicular recording media, at granular (<10 nm) length scales. The magnetic contribution to the scattering is measured as the magnetization is reversed by an external field, providing unique spatial information on the switching process. A simple model of noninteracting nanomagnetic grains provides a good description of the data and an analysis of the grain-size dependent reversal provides strong evidence for an increase in magnetic anisotropy with grain diameter.

AB - Polarized small-angle neutron scattering has been used to measure the magnetic structure of a CoCrPt–SiOx thin-film data storage layer, contained within a writable perpendicular recording media, at granular (<10 nm) length scales. The magnetic contribution to the scattering is measured as the magnetization is reversed by an external field, providing unique spatial information on the switching process. A simple model of noninteracting nanomagnetic grains provides a good description of the data and an analysis of the grain-size dependent reversal provides strong evidence for an increase in magnetic anisotropy with grain diameter.

U2 - 10.1063/1.3486680

DO - 10.1063/1.3486680

M3 - Article

SN - 0003-6951

VL - 97

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 11

M1 - 112503

ER -

Size-dependent reversal of grains in perpendicular magnetic recording media measured by small-angle polarized neutron scattering

Abstract

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Advanced Characterisation of Magnetic: Advanced Characterisation of Magnetic Recording Media using Neutron Scattering

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