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Abstract
The size and the shape of graphene layers in commercial conductive carbon blacks, Super P® and Super S®, have been determined from powder X-ray diffraction data. Using a refinement procedure based on the fundamental diffraction equation of Debye, it is shown that the ordered regions within the layers of both materials are of elliptical shape, curved in a cylindrical fashion along the longer axis of the ellipse. The regions are greater in Super P®, ellipse axes: 5.4 and 2.2 nm, than in Super S®, 4.6 and 2.1 nm, and less curved, curvature radii: 12.7 and 11.7 nm respectively. There is no crystallographic registry between layers that are equidistantly stacked into concentric groups of 6 or 7, on average.
Original language | English |
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Pages (from-to) | 24-30 |
Journal | Journal of Applied Crystallography |
Volume | 49 |
Issue number | 1 |
DOIs | |
Publication status | Published - Feb 2016 |
Keywords
- Graphene
- Powder diffraction
- Debye equation
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