Settling the "Dead Layer" Debate in Nanoscale Capacitors

Li-Wu Chang, Morin Alexe, James F. Scott, J. Marty Gregg*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

90 Citations (Scopus)

Abstract

Permittivity peaks in single crystal thin film capacitors are strongly suppressed compared to bulk in the case of Pt/SrTiO(3)/Pt, but are relatively unaffected in Pt/BaTiO(3)/Pt structures. This is consistent with the recent suggestion that subtle variations in interfacial bonding between the dielectric and electrode are critical in determining the presence or absence of inherent dielectric "dead layers".

Original languageEnglish
Pages (from-to)4911-4914
Number of pages5
JournalAdvanced Materials
Volume21
Issue number48
DOIs
Publication statusPublished - 28 Dec 2009

Keywords

  • THIN-FILM CAPACITORS
  • THICKNESS DEPENDENCE
  • DIELECTRIC RESPONSE
  • FERROELECTRICS
  • (BA,SR)TIO3
  • MEMORY
  • FIELD
  • SIZE

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