Settling the "Dead Layer" Debate in Nanoscale Capacitors

Li-Wu Chang; Morin Alexe; James F. Scott; J. Marty Gregg

doi:10.1002/adma.200901756

Settling the "Dead Layer" Debate in Nanoscale Capacitors

Li-Wu Chang, Morin Alexe, James F. Scott, J. Marty Gregg^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

Permittivity peaks in single crystal thin film capacitors are strongly suppressed compared to bulk in the case of Pt/SrTiO(3)/Pt, but are relatively unaffected in Pt/BaTiO(3)/Pt structures. This is consistent with the recent suggestion that subtle variations in interfacial bonding between the dielectric and electrode are critical in determining the presence or absence of inherent dielectric "dead layers".

Original language	English
Pages (from-to)	4911-4914
Number of pages	5
Journal	Advanced Materials
Volume	21
Issue number	48
DOIs	https://doi.org/10.1002/adma.200901756
Publication status	Published - 28 Dec 2009

Keywords

THIN-FILM CAPACITORS
THICKNESS DEPENDENCE
DIELECTRIC RESPONSE
FERROELECTRICS
(BA,SR)TIO3
MEMORY
FIELD
SIZE

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10.1002/adma.200901756

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title = "Settling the {"}Dead Layer{"} Debate in Nanoscale Capacitors",

abstract = "Permittivity peaks in single crystal thin film capacitors are strongly suppressed compared to bulk in the case of Pt/SrTiO(3)/Pt, but are relatively unaffected in Pt/BaTiO(3)/Pt structures. This is consistent with the recent suggestion that subtle variations in interfacial bonding between the dielectric and electrode are critical in determining the presence or absence of inherent dielectric {"}dead layers{"}.",

keywords = "THIN-FILM CAPACITORS, THICKNESS DEPENDENCE, DIELECTRIC RESPONSE, FERROELECTRICS, (BA,SR)TIO3, MEMORY, FIELD, SIZE",

author = "Li-Wu Chang and Morin Alexe and Scott, {James F.} and Gregg, {J. Marty}",

year = "2009",

month = dec,

day = "28",

doi = "10.1002/adma.200901756",

language = "English",

volume = "21",

pages = "4911--4914",

journal = "Advanced Materials",

issn = "0935-9648",

publisher = "Wiley-Blackwell",

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T1 - Settling the "Dead Layer" Debate in Nanoscale Capacitors

AU - Chang, Li-Wu

AU - Alexe, Morin

AU - Scott, James F.

AU - Gregg, J. Marty

PY - 2009/12/28

Y1 - 2009/12/28

N2 - Permittivity peaks in single crystal thin film capacitors are strongly suppressed compared to bulk in the case of Pt/SrTiO(3)/Pt, but are relatively unaffected in Pt/BaTiO(3)/Pt structures. This is consistent with the recent suggestion that subtle variations in interfacial bonding between the dielectric and electrode are critical in determining the presence or absence of inherent dielectric "dead layers".

AB - Permittivity peaks in single crystal thin film capacitors are strongly suppressed compared to bulk in the case of Pt/SrTiO(3)/Pt, but are relatively unaffected in Pt/BaTiO(3)/Pt structures. This is consistent with the recent suggestion that subtle variations in interfacial bonding between the dielectric and electrode are critical in determining the presence or absence of inherent dielectric "dead layers".

KW - THIN-FILM CAPACITORS

KW - THICKNESS DEPENDENCE

KW - DIELECTRIC RESPONSE

KW - FERROELECTRICS

KW - (BA,SR)TIO3

KW - MEMORY

KW - FIELD

KW - SIZE

U2 - 10.1002/adma.200901756

DO - 10.1002/adma.200901756

M3 - Article

SN - 0935-9648

VL - 21

SP - 4911

EP - 4914

JO - Advanced Materials

JF - Advanced Materials

IS - 48

ER -

Settling the "Dead Layer" Debate in Nanoscale Capacitors

Abstract

Keywords

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