Abstract
Response to uniaxial stress has become a major probe of electronic
materials. Tunable uniaxial stress may be applied using piezoelectric
actuators, and so far two methods have been developed to couple samples
to actuators. In one, actuators apply force along the length of a free,
beam-like sample, allowing very large strains to be achieved. In the
other, samples are affixed directly to piezoelectric actuators, allowing
the study of mechanically delicate materials. Here, we describe an
approach that merges the two: thin samples are affixed to a substrate,
which is then pressurized uniaxially using piezoelectric actuators.
Using this approach, we demonstrate the application of large elastic
strains to mechanically delicate samples: the van der Waals-bonded
material FeSe and a sample of CeAuSb2 that was shaped with a focused ion beam.
Original language | English |
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Article number | 083902 |
Number of pages | 10 |
Journal | Review of Scientific Instruments |
Volume | 91 |
Issue number | 8 |
DOIs | |
Publication status | Published - 3 Aug 2020 |