Random super-prism wavelength meter

Michael Mazilu; Tom Vettenburg; Andrea Di Falco; Kishan Dholakia

doi:10.1364/OL.39.000096

Random super-prism wavelength meter

Michael Mazilu^*, Tom Vettenburg, Andrea Di Falco, Kishan Dholakia

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

The speckle pattern arising from a thin random, disordered scatterer may be used to detect the transversal mode of an incident beam. On the other hand, speckle patterns originating from meter-long multimode fibers can be used to detect different wavelengths. Combining these approaches, we develop a method that uses a thin random scattering medium to measure the wavelength of a near-infrared laser beam with picometer resolution. The method is based on the application of principal component analysis, which is used for pattern recognition and is applied here to the case of speckle pattern categorization.

Original language	English
Pages (from-to)	96-99
Number of pages	4
Journal	Optics Letters
Volume	39
Issue number	1
Early online date	20 Dec 2013
DOIs	https://doi.org/10.1364/OL.39.000096
Publication status	Published - 1 Jan 2014

Keywords

Spectrometer
Resolution
Media
Fiber

Access to Document

10.1364/OL.39.000096

Mazilu_2013_OL_Random
© 2014 Optical Society of America
Final published version, 499 KB

Wavelength meter: Random diffuser based high resolution wavelength meter
Mazilu, M. (PI) & Dholakia, K. (CoI)
EPSRC
1/09/13 → 31/12/14
Project: Standard
Hawking Radiation in Dielectric Horizon: Hawking Radiation in Dielectric Horizon Analogues
Di Falco, A. (PI)
EPSRC
30/06/12 → 29/06/15
Project: Standard
Challening the Limits of Photonics: stru: Challenging the Limits of Photonics: Structured Light
Dholakia, K. (PI), Krauss, T. F. (CoI) & Samuel, I. D. W. (CoI)
EPSRC
1/06/12 → 31/05/17
Project: Standard

Michael Mazilu
- mm17st-andrews.acuk
- School of Physics and Astronomy - Senior Lecturer
- Centre for Biophotonics
Person: Academic

Cite this

@article{dfa7c7e3c7184fdf9221fc95cf332f3f,

title = "Random super-prism wavelength meter",

abstract = "The speckle pattern arising from a thin random, disordered scatterer may be used to detect the transversal mode of an incident beam. On the other hand, speckle patterns originating from meter-long multimode fibers can be used to detect different wavelengths. Combining these approaches, we develop a method that uses a thin random scattering medium to measure the wavelength of a near-infrared laser beam with picometer resolution. The method is based on the application of principal component analysis, which is used for pattern recognition and is applied here to the case of speckle pattern categorization.",

keywords = "Spectrometer, Resolution, Media, Fiber",

author = "Michael Mazilu and Tom Vettenburg and {Di Falco}, Andrea and Kishan Dholakia",

note = "The authors acknowledge the UK Engineering and Physical Sciences Research Council for funding (EP/J004200/1). ADF is a EPSRC fellow (EP/I004602/1). Kishan Dholakia is a Royal Society-Wolfson Merit Award Holder.",

year = "2014",

month = jan,

day = "1",

doi = "10.1364/OL.39.000096",

language = "English",

volume = "39",

pages = "96--99",

journal = "Optics Letters",

issn = "0146-9592",

publisher = "OPTICAL SOC AMER",

number = "1",

}

TY - JOUR

T1 - Random super-prism wavelength meter

AU - Mazilu, Michael

AU - Vettenburg, Tom

AU - Di Falco, Andrea

AU - Dholakia, Kishan

N1 - The authors acknowledge the UK Engineering and Physical Sciences Research Council for funding (EP/J004200/1). ADF is a EPSRC fellow (EP/I004602/1). Kishan Dholakia is a Royal Society-Wolfson Merit Award Holder.

PY - 2014/1/1

Y1 - 2014/1/1

N2 - The speckle pattern arising from a thin random, disordered scatterer may be used to detect the transversal mode of an incident beam. On the other hand, speckle patterns originating from meter-long multimode fibers can be used to detect different wavelengths. Combining these approaches, we develop a method that uses a thin random scattering medium to measure the wavelength of a near-infrared laser beam with picometer resolution. The method is based on the application of principal component analysis, which is used for pattern recognition and is applied here to the case of speckle pattern categorization.

AB - The speckle pattern arising from a thin random, disordered scatterer may be used to detect the transversal mode of an incident beam. On the other hand, speckle patterns originating from meter-long multimode fibers can be used to detect different wavelengths. Combining these approaches, we develop a method that uses a thin random scattering medium to measure the wavelength of a near-infrared laser beam with picometer resolution. The method is based on the application of principal component analysis, which is used for pattern recognition and is applied here to the case of speckle pattern categorization.

KW - Spectrometer

KW - Resolution

KW - Media

KW - Fiber

U2 - 10.1364/OL.39.000096

DO - 10.1364/OL.39.000096

M3 - Article

SN - 0146-9592

VL - 39

SP - 96

EP - 99

JO - Optics Letters

JF - Optics Letters

IS - 1

ER -

Random super-prism wavelength meter

Abstract

Keywords

Access to Document

Fingerprint

Projects

Wavelength meter: Random diffuser based high resolution wavelength meter

Hawking Radiation in Dielectric Horizon: Hawking Radiation in Dielectric Horizon Analogues

Challening the Limits of Photonics: stru: Challenging the Limits of Photonics: Structured Light

Profiles

Michael Mazilu

Cite this