Quantum Point Contact Microscopy

Yong-hui Zhang; Peter Wahl; Klaus Kern

doi:10.1021/nl201912u

Quantum Point Contact Microscopy

Yong-hui Zhang, Peter Wahl, Klaus Kern

Research output: Contribution to journal › Article › peer-review

Abstract

We introduce quantum point contact microscopy (QPCM) as a novel method for surface characterization, where the conductance through a quantum point contact formed by a metal atom between the tip of a scanning tunneling microscope and the surface is mapped across the surface. Application of QPCM to copper and gold (111) shows reproducibly atomic resolution, on gold (111) the alternating atomic stacking of the surface reconstruction is observed in real space. The perspectives for chemical sensitivity in QPCM images are demonstrated for an iron platinum surface alloy where we observe local variations of the transport current due to changes in the chemical environment of the point contact.

Original language	English
Pages (from-to)	3838-3843
Number of pages	6
Journal	Nano Letters
Volume	11
Issue number	9
DOIs	https://doi.org/10.1021/nl201912u
Publication status	Published - Sept 2011

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title = "Quantum Point Contact Microscopy",

abstract = "We introduce quantum point contact microscopy (QPCM) as a novel method for surface characterization, where the conductance through a quantum point contact formed by a metal atom between the tip of a scanning tunneling microscope and the surface is mapped across the surface. Application of QPCM to copper and gold (111) shows reproducibly atomic resolution, on gold (111) the alternating atomic stacking of the surface reconstruction is observed in real space. The perspectives for chemical sensitivity in QPCM images are demonstrated for an iron platinum surface alloy where we observe local variations of the transport current due to changes in the chemical environment of the point contact.",

author = "Yong-hui Zhang and Peter Wahl and Klaus Kern",

year = "2011",

month = sep,

doi = "10.1021/nl201912u",

language = "English",

volume = "11",

pages = "3838--3843",

journal = "Nano Letters",

issn = "1530-6984",

publisher = "American Chemical Society (ACS)",

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T1 - Quantum Point Contact Microscopy

AU - Zhang, Yong-hui

AU - Wahl, Peter

AU - Kern, Klaus

PY - 2011/9

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N2 - We introduce quantum point contact microscopy (QPCM) as a novel method for surface characterization, where the conductance through a quantum point contact formed by a metal atom between the tip of a scanning tunneling microscope and the surface is mapped across the surface. Application of QPCM to copper and gold (111) shows reproducibly atomic resolution, on gold (111) the alternating atomic stacking of the surface reconstruction is observed in real space. The perspectives for chemical sensitivity in QPCM images are demonstrated for an iron platinum surface alloy where we observe local variations of the transport current due to changes in the chemical environment of the point contact.

AB - We introduce quantum point contact microscopy (QPCM) as a novel method for surface characterization, where the conductance through a quantum point contact formed by a metal atom between the tip of a scanning tunneling microscope and the surface is mapped across the surface. Application of QPCM to copper and gold (111) shows reproducibly atomic resolution, on gold (111) the alternating atomic stacking of the surface reconstruction is observed in real space. The perspectives for chemical sensitivity in QPCM images are demonstrated for an iron platinum surface alloy where we observe local variations of the transport current due to changes in the chemical environment of the point contact.

U2 - 10.1021/nl201912u

DO - 10.1021/nl201912u

M3 - Article

SN - 1530-6984

VL - 11

SP - 3838

EP - 3843

JO - Nano Letters

JF - Nano Letters

IS - 9

ER -

Quantum Point Contact Microscopy

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