Problems and solutions when quantifying nitrogen in silicate and oxide minerals and glasses using electron probe microanalysis

Eleanor R. Mare*, Jeff Chen, Iris Buisman, Chris Hayward, Antony D. Burnham, Caterina Melai, Eva E. Stüeken, Geoffrey Bromley, Sami Mikhail*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

With growing interest in the Earth's deep nitrogen cycle, electron probe microanalysis is increasingly used to quantify nitrogen in minerals and glasses. However, measuring nitrogen by electron microprobe comes with challenges, including beam sensitivity and differences in peak and background shapes between sample and reference materials. This study provides a robust analytical protocol to addresses these issues. We gathered mineral and glass reference materials with known nitrogen mass fractions from previous work, and synthesised additional glasses with nitrogen quantified independently by gas-source mass spectrometry. Our method uses nitrides as calibration materials because of their beam stability and high nitrogen mass fraction. We assess peak shapes to implement an area-peak factor correction, and account for curved backgrounds using a four-point background correction. Importantly, we describe how to estimate uncertainties on both background and area-peak factor corrections, which is required to assess detection limits but has been largely overlooked in previous studies. Our method yields nitrogen mass fractions within uncertainty for five out of seven reference materials, with two exceptions highlighting the need for further refinement. We provide Python code for applying the corrections and calculating uncertainties, allowing our method to be implemented by any researcher with access to an electron microprobe laboratory.
Original languageEnglish
Number of pages22
JournalGeostandards and Geoanalytical Research
VolumeEarly View
Early online date25 Apr 2025
DOIs
Publication statusE-pub ahead of print - 25 Apr 2025

Keywords

  • Nitrogen
  • Light elements
  • Electron probe microanalysis
  • EPMA
  • Multi-point background correction
  • Area-peak factor correction

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