Patterned dielectric mirrors for lateral overgrowth of GaN-based lasers

T Kim, RW Martin, IN Watson, MD Dawson, Thomas Fraser Krauss, JH Marsh, RM De La Rue

Research output: Other contribution

9 Citations (Scopus)

Abstract

The performance of GaN-based surface-emitting lasers may be greatly improved by the use of highly-reflecting SiO2/ZrO2 multilayers for both cavity mirrors. We consider some of the limitations of GaN/Al(Ga)N multilayer mirrors and discuss alternative routes for incorporating dielectric multilayers within InGaN/GaN quantum well surface-emitting devices, using lateral epitaxial overgrowth. The use of lateral overgrowth techniques promise the benefit of reduced dislocation densities within the active region. The use of single layer lift-off techniques for the fabrication of patterned mirror templates suitable for overgrowth on GaN-on-sapphire is described. (C) 2001 Elsevier Science B.V. All rights reserved.

Original languageEnglish
Volume82
Publication statusPublished - 22 May 2001

Keywords

  • nitride semiconductors
  • VCSELs
  • microcavities
  • oxide mirrors
  • SURFACE-EMITTING LASER
  • EMISSION

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