Origin of the near-band-edge luminescence in MgxZn1-xO alloys

Alexander Mueller*, Marko Stoelzel, Christof Dietrich, Gabriele Benndorf, Michael Lorenz, Marius Grundmann

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The carrier dynamics of donor-bound and free excitons, localized in the alloy disorder potential, were investigated for MgxZn1-xO (0.08 <x <0.33) thin films. The measured transients show a fast decrease in the luminescence intensity within the first nanoseconds, followed by a slow, strongly nonexponential decay. Shortly after the excitation pulse, the time-delayed spectra are dominated by the (D-0,X) recombination. With increasing time, the free exciton recombination becomes visible on the high-energy side, dominating the spectra at large times after the excitation pulse. By fitting the transients with nonexponential model decay functions, we can deconvolve the luminescence spectra. As expected, the mean decay time of the excitons localized in the alloy disorder potential significantly increases with increasing Mg content.

Original languageEnglish
Article number013704
Number of pages6
JournalJournal of Applied Physics
Volume107
Issue number1
DOIs
Publication statusPublished - 1 Jan 2010

Keywords

  • excitons
  • II-VI semiconductors
  • localised states
  • magnesium compounds
  • photoluminescence
  • semiconductor thin films
  • spectral line intensity
  • time resolved spectra
  • wide band gap semiconductors
  • zinc compounds
  • PULSED-LASER DEPOSITION
  • TIME-RESOLVED PHOTOLUMINESCENCE
  • ZNO THIN-FILMS
  • LOCALIZED EXCITONS
  • UNDERLYING DISTRIBUTIONS
  • MATHEMATICAL FUNCTIONS
  • EPITAXIAL ZNO
  • QUANTUM-WELLS
  • DECAY
  • DISORDER

Fingerprint

Dive into the research topics of 'Origin of the near-band-edge luminescence in MgxZn1-xO alloys'. Together they form a unique fingerprint.

Cite this