Optical determination of interface roughness in multilayered semiconductor structures

M Mazilu, V Donchev, O Blum, Alan Miller

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	633-636
Journal	Applied Physics B: Lasers and Optics
Volume	68
Issue number	3
DOIs	https://doi.org/10.1007/s003400050677
Publication status	Published - Mar 1999

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title = "Optical determination of interface roughness in multilayered semiconductor structures",

author = "M Mazilu and V Donchev and O Blum and Alan Miller",

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language = "English",

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pages = "633--636",

journal = "Applied Physics B: Lasers and Optics",

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AU - Donchev, V

AU - Blum, O

AU - Miller, Alan

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