Optical determination of interface roughness in multilayered semiconductor structures

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	633-636
Journal	Applied Physics B: Lasers and Optics
Volume	68
Issue number	3
DOIs	https://doi.org/10.1007/s003400050677
Publication status	Published - Mar 1999

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@article{30fdb6ee793a40b99637685cb376c748,

title = "Optical determination of interface roughness in multilayered semiconductor structures",

author = "M Mazilu and V Donchev and O Blum and Alan Miller",

year = "1999",

month = mar,

doi = "10.1007/s003400050677",

language = "English",

volume = "68",

pages = "633--636",

journal = "Applied Physics B: Lasers and Optics",

publisher = "Springer-Verlag",

number = "3",

}

TY - JOUR

T1 - Optical determination of interface roughness in multilayered semiconductor structures

AU - Mazilu, M

AU - Donchev, V

AU - Blum, O

AU - Miller, Alan

PY - 1999/3

Y1 - 1999/3

UR - https://www.scopus.com/pages/publications/0033100633

U2 - 10.1007/s003400050677

DO - 10.1007/s003400050677

M3 - Article

VL - 68

SP - 633

EP - 636

JO - Applied Physics B: Lasers and Optics

JF - Applied Physics B: Lasers and Optics

IS - 3

ER -