@inproceedings{28347b27bbc643e2b71be0b3e7f3c583,
title = "On-chip nano-localization via transverse kerker scattering",
abstract = "Here we present a transverse Kerker scattering based sub-wavelength localization technique transferred to a chip-scale all-optical displacement sensing device, which could act as a metrological instrument in modern lithography and microscopy, or monitor system drifts. ",
author = "A. Bag and M. Neugebauer and U. Mick and S. Christiansen and S.A. Schulz and P. Banzer",
note = "This work was supported by the European Commission Horizon 2020 research and innovation program under the Future and Emerging Technologies Open Grant Agreement Super-Pixels No. 829116.; 2020 Frontiers in Optics Conference (FiO 2020), FiO 2020 ; Conference date: 14-09-2020 Through 17-09-2020",
year = "2020",
month = sep,
day = "14",
doi = "10.1364/FIO.2020.FW1B.5",
language = "English",
isbn = "9781557528209",
series = "OSA Technical Digest",
publisher = "Optical Society of American (OSA)",
booktitle = "Frontiers in Optics/Laser Science 2020",
address = "United States",
}