Normal incidence X-ray standing wave analysis of thin gold films

Christopher J. Satterley, Kevin R. J. Lovelock, Ian Thom, Vinod R. Dhanak, Manfred Buck, Robert G. Jones

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

Normal incidence X-ray standing wave (NIXSW) analysis has been successfully performed on epitaxial gold films on mica substrates using reflection from the (I 11) planes parallel to the surface. We show that NIXSW can be used to monitor the decrease in order within the gold film caused by annealing, and the position of sulfur within a monolayer of methyl thiolate (CH3S-) on the surface. The Au-S layer spacing was found to be 2.54 +/- 0.05 angstrom, in close agreement with previous work on a single crystal system. (c) 2006 Elsevier B.V. All rights reserved.

Original languageEnglish
Pages (from-to)4825-4828
Number of pages4
JournalSurface Science
Volume600
Issue number21
DOIs
Publication statusPublished - 1 Nov 2006

Keywords

  • X-ray standing waves
  • epitaxy
  • self assembly
  • surface structure
  • gold
  • mica
  • thiols
  • single crystal epitaxy
  • SURFACE-STRUCTURE DETERMINATION
  • SELF-ASSEMBLED MONOLAYERS

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