New quartz and zircon Si isotopic reference materials for precise and accurate SIMS isotopic microanalysis

Yu Liu, Xian-Hua Li*, Paul S. Savage, Guo-Qiang Tang, Qiu-Li Li, Hui-Min Yu, Fang Huang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Downloads (Pure)

Abstract

Here we report the Si isotope compositions of four potential reference materials, including one fused quartz glass (Glass-Qtz), one natural quartz (Qinghu-Qtz), and two natural zircons (Qinghu-Zir and Penglai-Zir), suitable for in-situ Si isotopic microanalysis. Repeated SIMS (Secondary Ion Mass Spectrometry) analyses demonstrate that these materials are more homogeneous in Si isotopes (with the spot-to-spot uncertainty of 0.090-0.102‰), compared with the widely used NIST RM 8546 (previously NBS-28) quartz standard (with the spot-to-spot uncertainty poorer than 0.16‰). Based on the solution-MC-ICP-MS determination, the recommended δ30Si values are −0.10 ± 0.04 ‰ (2SD), −0.03 ± 0.05 ‰ (2SD), −0.45 ± 0.06 ‰ (2SD), and −0.34 ± 0.06 ‰ (2SD), for Glass-Qtz, Qinghu-Qtz, Qinghu-Zir, and Penglai-Zir, respectively. Our results reveal no detectable matrix effect on SIMS Si isotopic microanalysis between the fused quartz glass (Glass-Qtz) and natural quartz (Qinghu-Qtz) standards. Therefore, we propose that this synthetic quartz glass may be used as an alternative, more homogenous standard for SIMS Si isotopic microanalysis of natural quartz samples.
Original languageEnglish
Pages (from-to)99-106
Number of pages8
JournalAtomic Spectroscopy
Volume43
Issue number2
DOIs
Publication statusPublished - 25 Apr 2022

Fingerprint

Dive into the research topics of 'New quartz and zircon Si isotopic reference materials for precise and accurate SIMS isotopic microanalysis'. Together they form a unique fingerprint.

Cite this