Near edge X-ray absorption fine structure spectroscopy as a tool to probe electronic and structural properties of thin organic films and liquids

Georg Hähner

doi:10.1039/b509853j

Near edge X-ray absorption fine structure spectroscopy as a tool to probe electronic and structural properties of thin organic films and liquids

Research output: Contribution to journal › Article › peer-review

192 Citations (Scopus)

Original language	English
Pages (from-to)	1244-1255
Journal	Chemical Society Reviews
Volume	35
Issue number	12
DOIs	https://doi.org/10.1039/b509853j
Publication status	Published - Dec 2006

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10.1039/b509853j

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@article{6af04e9432534f809533531170f813d9,

title = "Near edge X-ray absorption fine structure spectroscopy as a tool to probe electronic and structural properties of thin organic films and liquids",

author = "Georg H{\"a}hner",

year = "2006",

month = dec,

doi = "10.1039/b509853j",

language = "English",

volume = "35",

pages = "1244--1255",

journal = "Chemical Society Reviews",

issn = "0306-0012",

publisher = "Royal Society of Chemistry",

number = "12",

}

TY - JOUR

T1 - Near edge X-ray absorption fine structure spectroscopy as a tool to probe electronic and structural properties of thin organic films and liquids

AU - Hähner, Georg

PY - 2006/12

Y1 - 2006/12

UR - http://www.scopus.com/inward/record.url?scp=33846196299&partnerID=8YFLogxK

UR - http://www.rsc.org/Publishing/Journals/CS/article.asp?doi=b509853j

U2 - 10.1039/b509853j

DO - 10.1039/b509853j

M3 - Article

SN - 0306-0012

VL - 35

SP - 1244

EP - 1255

JO - Chemical Society Reviews

JF - Chemical Society Reviews

IS - 12

ER -

Near edge X-ray absorption fine structure spectroscopy as a tool to probe electronic and structural properties of thin organic films and liquids

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