Nanoscale polarisation switching and leakage currents in (Ba0.955Ca0.045)(Zr0.17Ti0.83)O3 epitaxial thin films

V.S. Puli, D.K. Pradhan, S. Adireddy, R. Martínez, P. Silwal, J.F. Scott, C.V. Ramana, D.B. Chrisey, R.S. Katiyar

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This paper investigates the crystal structure, ferroelectric, temperature-dependent leakage current conduction mechanism and the piezoresponse force microscopy (PFM) behaviours of (Ba0.955Ca0.045) (Zr0.17Ti0.83)O3–BZT–BCT (x=0.15) films at the vicinity of the morphotropic phase boundary (MPB) of the [(1  −  x) BaZr0.20Ti0.80O3xBa0.70Ca0.30TiO3] (x=0.15) composition. Epitaxial BZT–BCT thin films were grown on conductive La0.5Sr0.5CoO3 (LSCO) layers coated onto MgO (1 0 0) single-crystal substrates by pulsed laser deposition (PLD). High resolution x-ray diffraction (HR-XRD) reciprocal space maps (RSMs) confirmed the epitaxy with in-plane tetragonal symmetry (c  <  a), and Raman spectra also revealed a tetragonal perovskite crystalline lattice structure. Polarisation studies demonstrate that BZT–BCT films exhibit a high saturation polarisation of 148 µC cm−2 and a high recoverable (discharged) energy-storage density of 39.11 J cm−3 at 2.08 MV cm−1. Temperature-dependent PE hysteresis loops resulted in a decrease in polarisation. Temperature-dependent leakage current behaviour was obtained and possible conduction mechanism is discussed. PPFM images revealed switchable ferroelectric piezoelectric contrasts after the application of a  ±9 V dc voltage on the conductive tip of the piezoresponse force microscope

Original languageEnglish
JournalJournal of Physics D : Applied Physics
Issue number35
Early online date7 Aug 2015
Publication statusPublished - 9 Sept 2015


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