Nanoscale mobility mapping in semiconducting polymer films

A. Alekseev; A. Yedrissov; G. J. Hedley; O. Ibraikulov; T. Heiser; I. D.W. Samuel; S. Kharintsev

doi:10.1016/j.ultramic.2020.113081

Nanoscale mobility mapping in semiconducting polymer films

A. Alekseev^*, A. Yedrissov, G. J. Hedley, O. Ibraikulov, T. Heiser, I. D.W. Samuel, S. Kharintsev

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Abstract

Local electrical properties of thin films of the polymer PTB7 are studied by conductive atomic force microscopy (C-AFM). Non-uniform nanoscale current distribution in the neat PTB7 film is revealed and connected with the existence of ordered PTB7 crystallites. The shape of local I-V curves is explained by the presence of space charge limited current. We modify an existing semi-empirical model for estimation of the nanoscale hole mobility from our experimental C-AFM measurements. The procedure of nanoscale charge mobility estimation was described and applied to the PTB7 films. The calculated average C-AFM hole mobility is in good agreement with macroscopic values reported for this material. Mapping of nanoscale hole mobility was achieved using the described procedure. Local mobility values, influenced by nanoscale structure, vary more than two times in value and have a root-mean-square value 0.22 × 10⁻⁸ m²/(Vs), which is almost 20% from average hole mobility.

Original language	English
Article number	113081
Journal	Ultramicroscopy
Volume	218
Early online date	22 Jul 2020
DOIs	https://doi.org/10.1016/j.ultramic.2020.113081
Publication status	Published - Nov 2020

Keywords

Charge carrier mobility
Conductive AFM
Current distribution
Organic semiconductor
Space charge limited current

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10.1016/j.ultramic.2020.113081

Alekseev_2020_Ultramicroscopy_AAM
Copyright © 2020 Elsevier B.V. All rights reserved. This work has been made available online in accordance with publisher policies or with permission. Permission for further reuse of this content should be sought from the publisher or the rights holder. This is the author created accepted manuscript following peer review and may differ slightly from the final published version. The final published version of this work is available at https://doi.org/10.1016/j.ultramic.2020.113081
Accepted author manuscript, 1.29 MBLicence: CC BY-NC-ND

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@article{4d3c65b66d2a467999d3c933306b6240,

title = "Nanoscale mobility mapping in semiconducting polymer films",

abstract = "Local electrical properties of thin films of the polymer PTB7 are studied by conductive atomic force microscopy (C-AFM). Non-uniform nanoscale current distribution in the neat PTB7 film is revealed and connected with the existence of ordered PTB7 crystallites. The shape of local I-V curves is explained by the presence of space charge limited current. We modify an existing semi-empirical model for estimation of the nanoscale hole mobility from our experimental C-AFM measurements. The procedure of nanoscale charge mobility estimation was described and applied to the PTB7 films. The calculated average C-AFM hole mobility is in good agreement with macroscopic values reported for this material. Mapping of nanoscale hole mobility was achieved using the described procedure. Local mobility values, influenced by nanoscale structure, vary more than two times in value and have a root-mean-square value 0.22 × 10−8 m2/(Vs), which is almost 20% from average hole mobility.",

keywords = "Charge carrier mobility, Conductive AFM, Current distribution, Organic semiconductor, Space charge limited current",

author = "A. Alekseev and A. Yedrissov and Hedley, {G. J.} and O. Ibraikulov and T. Heiser and Samuel, {I. D.W.} and S. Kharintsev",

note = "This work was supported by grant No 19-12-00066 of the Russian Science Foundation.",

year = "2020",

month = nov,

doi = "10.1016/j.ultramic.2020.113081",

language = "English",

volume = "218",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

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TY - JOUR

T1 - Nanoscale mobility mapping in semiconducting polymer films

AU - Alekseev, A.

AU - Yedrissov, A.

AU - Hedley, G. J.

AU - Ibraikulov, O.

AU - Heiser, T.

AU - Samuel, I. D.W.

AU - Kharintsev, S.

N1 - This work was supported by grant No 19-12-00066 of the Russian Science Foundation.

PY - 2020/11

Y1 - 2020/11

N2 - Local electrical properties of thin films of the polymer PTB7 are studied by conductive atomic force microscopy (C-AFM). Non-uniform nanoscale current distribution in the neat PTB7 film is revealed and connected with the existence of ordered PTB7 crystallites. The shape of local I-V curves is explained by the presence of space charge limited current. We modify an existing semi-empirical model for estimation of the nanoscale hole mobility from our experimental C-AFM measurements. The procedure of nanoscale charge mobility estimation was described and applied to the PTB7 films. The calculated average C-AFM hole mobility is in good agreement with macroscopic values reported for this material. Mapping of nanoscale hole mobility was achieved using the described procedure. Local mobility values, influenced by nanoscale structure, vary more than two times in value and have a root-mean-square value 0.22 × 10−8 m2/(Vs), which is almost 20% from average hole mobility.

AB - Local electrical properties of thin films of the polymer PTB7 are studied by conductive atomic force microscopy (C-AFM). Non-uniform nanoscale current distribution in the neat PTB7 film is revealed and connected with the existence of ordered PTB7 crystallites. The shape of local I-V curves is explained by the presence of space charge limited current. We modify an existing semi-empirical model for estimation of the nanoscale hole mobility from our experimental C-AFM measurements. The procedure of nanoscale charge mobility estimation was described and applied to the PTB7 films. The calculated average C-AFM hole mobility is in good agreement with macroscopic values reported for this material. Mapping of nanoscale hole mobility was achieved using the described procedure. Local mobility values, influenced by nanoscale structure, vary more than two times in value and have a root-mean-square value 0.22 × 10−8 m2/(Vs), which is almost 20% from average hole mobility.

KW - Charge carrier mobility

KW - Conductive AFM

KW - Current distribution

KW - Organic semiconductor

KW - Space charge limited current

U2 - 10.1016/j.ultramic.2020.113081

DO - 10.1016/j.ultramic.2020.113081

M3 - Article

AN - SCOPUS:85088753775

SN - 0304-3991

VL - 218

JO - Ultramicroscopy

JF - Ultramicroscopy

M1 - 113081

ER -

Nanoscale mobility mapping in semiconducting polymer films

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