Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

Sam M. Stevens; Pablo Cubillas; Kjell Jansson; Osamu Terasaki; Michael W. Anderson; Paul A. Wright; Maria Castro

doi:10.1039/b804440f

Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

Sam M. Stevens, Pablo Cubillas, Kjell Jansson, Osamu Terasaki, Michael W. Anderson, Paul A. Wright, Maria Castro

Research output: Contribution to journal › Article › peer-review

Abstract

The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.

Original language	English
Pages (from-to)	3894-3896
Number of pages	3
Journal	Chemical Communications
Issue number	33
DOIs	https://doi.org/10.1039/b804440f
Publication status	Published - 2008

Keywords

ZEOLITES
CRYSTALS
GROWTH

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10.1039/b804440f

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@article{d6897c4e83b944fa9626c4748fbce014,

title = "Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy",

abstract = "The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.",

keywords = "ZEOLITES, CRYSTALS, GROWTH",

author = "Stevens, {Sam M.} and Pablo Cubillas and Kjell Jansson and Osamu Terasaki and Anderson, {Michael W.} and Wright, {Paul A.} and Maria Castro",

year = "2008",

doi = "10.1039/b804440f",

language = "English",

pages = "3894--3896",

journal = "Chemical Communications",

issn = "1359-7345",

publisher = "Royal Society of Chemistry",

number = "33",

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T1 - Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

AU - Stevens, Sam M.

AU - Cubillas, Pablo

AU - Jansson, Kjell

AU - Terasaki, Osamu

AU - Anderson, Michael W.

AU - Wright, Paul A.

AU - Castro, Maria

PY - 2008

Y1 - 2008

N2 - The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.

AB - The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.

KW - ZEOLITES

KW - CRYSTALS

KW - GROWTH

UR - http://www.scopus.com/inward/record.url?scp=50249146850&partnerID=8YFLogxK

U2 - 10.1039/b804440f

DO - 10.1039/b804440f

M3 - Article

SN - 1359-7345

SP - 3894

EP - 3896

JO - Chemical Communications

JF - Chemical Communications

IS - 33

ER -

Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

Abstract

Keywords

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