Mueller matrix error correction for a fringe-free interferometry system

M L  Begbie; W  Sibbett; M J  Padgett

Mueller matrix error correction for a fringe-free interferometry system

M L Begbie, W Sibbett, M J Padgett

School of Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

Abstract

We present an automated surface profiling system based on a shearing interferometer, in which precise measurement of the polarization states eliminates fringe ambiguity. A full error correction based on Mueller matrices allows comparatively inaccurate but rapidly switchable liquid-crystal wave plates to be used, enabling unambiguous profile information to be obtained in real time. (C) 2001 Optical Society of America.

Original language	English
Pages (from-to)	3205-3210
Number of pages	6
Journal	Applied Optics
Volume	40
Publication status	Published - 1 Jul 2001

Keywords

SURFACE

Cite this

@article{cdecbbb863614d59bbd339701d4eba30,

title = "Mueller matrix error correction for a fringe-free interferometry system",

abstract = "We present an automated surface profiling system based on a shearing interferometer, in which precise measurement of the polarization states eliminates fringe ambiguity. A full error correction based on Mueller matrices allows comparatively inaccurate but rapidly switchable liquid-crystal wave plates to be used, enabling unambiguous profile information to be obtained in real time. (C) 2001 Optical Society of America.",

keywords = "SURFACE",

author = "Begbie, \{M L\} and W Sibbett and Padgett, \{M J\}",

year = "2001",

month = jul,

day = "1",

language = "English",

volume = "40",

pages = "3205--3210",

journal = "Applied Optics",

issn = "0003-6935",

publisher = "The Optical Society",

}

TY - JOUR

T1 - Mueller matrix error correction for a fringe-free interferometry system

AU - Begbie, M L

AU - Sibbett, W

AU - Padgett, M J

PY - 2001/7/1

Y1 - 2001/7/1

N2 - We present an automated surface profiling system based on a shearing interferometer, in which precise measurement of the polarization states eliminates fringe ambiguity. A full error correction based on Mueller matrices allows comparatively inaccurate but rapidly switchable liquid-crystal wave plates to be used, enabling unambiguous profile information to be obtained in real time. (C) 2001 Optical Society of America.

AB - We present an automated surface profiling system based on a shearing interferometer, in which precise measurement of the polarization states eliminates fringe ambiguity. A full error correction based on Mueller matrices allows comparatively inaccurate but rapidly switchable liquid-crystal wave plates to be used, enabling unambiguous profile information to be obtained in real time. (C) 2001 Optical Society of America.

KW - SURFACE

UR - https://www.scopus.com/pages/publications/0035411971

M3 - Article

SN - 0003-6935

VL - 40

SP - 3205

EP - 3210

JO - Applied Optics

JF - Applied Optics

ER -

Mueller matrix error correction for a fringe-free interferometry system

Abstract

Keywords

Other files and links

Fingerprint

Cite this