Mueller matrix error correction for a fringe-free interferometry system

M L  Begbie; W  Sibbett; M J  Padgett

Mueller matrix error correction for a fringe-free interferometry system

M L Begbie, W Sibbett, M J Padgett

School of Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

Abstract

We present an automated surface profiling system based on a shearing interferometer, in which precise measurement of the polarization states eliminates fringe ambiguity. A full error correction based on Mueller matrices allows comparatively inaccurate but rapidly switchable liquid-crystal wave plates to be used, enabling unambiguous profile information to be obtained in real time. (C) 2001 Optical Society of America.

Original language	English
Pages (from-to)	3205-3210
Number of pages	6
Journal	Applied Optics
Volume	40
Publication status	Published - 1 Jul 2001

Keywords

SURFACE

Cite this

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abstract = "We present an automated surface profiling system based on a shearing interferometer, in which precise measurement of the polarization states eliminates fringe ambiguity. A full error correction based on Mueller matrices allows comparatively inaccurate but rapidly switchable liquid-crystal wave plates to be used, enabling unambiguous profile information to be obtained in real time. (C) 2001 Optical Society of America.",

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AU - Padgett, M J

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AB - We present an automated surface profiling system based on a shearing interferometer, in which precise measurement of the polarization states eliminates fringe ambiguity. A full error correction based on Mueller matrices allows comparatively inaccurate but rapidly switchable liquid-crystal wave plates to be used, enabling unambiguous profile information to be obtained in real time. (C) 2001 Optical Society of America.

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JO - Applied Optics

JF - Applied Optics

ER -

Mueller matrix error correction for a fringe-free interferometry system

Abstract

Keywords

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