MIRC closure phase studies for high precision measurements

M. Zhao, J.~D. Monnier, X. Che, T. ten Brummelaar, E. Pedretti, N.~D. Thureau

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationSociety of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
Volume7734
DOIs
Publication statusPublished - 1 Jul 2010

Publication series

NameSociety of Photo-Optical Instrumentation Engineers (SPIE) Conference Series

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