Measuring the silion fluoride bond distance in zeolites

R J  Darton; D H  Brouwer; C A  Fyfe; L A  Villaescusa; R E  Morris

Measuring the silion fluoride bond distance in zeolites

R J Darton, D H Brouwer, C A Fyfe, L A Villaescusa, R E Morris

Research output: Book/Report › Book

Abstract

A common misconception is that X-ray diffraction is the best way to measure bond distances. However, in some cases where disorder is present it can yield incorrect answers. The silicon-fluoride bond distance in fluoride-containing zeolite SFF has been measured using two magic angle spinning NMR techniques. Both techniques, variable contact time cross polarization and spinning side hand intensity fitting give shorter Si-F bond distances than X-ray diffraction.

Original language	English
Publisher	Unknown Publisher
Number of pages	5
Publication status	Published - 2004

Keywords

SOLID-STATE NMR
5-COORDINATE SILICON
MOLECULAR-SIEVES
MEDIA
TEMPLATE
LOCATION
COMPLEX
IONS
IFR
STF

Cite this

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TY - BOOK

T1 - Measuring the silion fluoride bond distance in zeolites

AU - Darton, R J

AU - Brouwer, D H

AU - Fyfe, C A

AU - Villaescusa, L A

AU - Morris, R E

PY - 2004

Y1 - 2004

N2 - A common misconception is that X-ray diffraction is the best way to measure bond distances. However, in some cases where disorder is present it can yield incorrect answers. The silicon-fluoride bond distance in fluoride-containing zeolite SFF has been measured using two magic angle spinning NMR techniques. Both techniques, variable contact time cross polarization and spinning side hand intensity fitting give shorter Si-F bond distances than X-ray diffraction.

AB - A common misconception is that X-ray diffraction is the best way to measure bond distances. However, in some cases where disorder is present it can yield incorrect answers. The silicon-fluoride bond distance in fluoride-containing zeolite SFF has been measured using two magic angle spinning NMR techniques. Both techniques, variable contact time cross polarization and spinning side hand intensity fitting give shorter Si-F bond distances than X-ray diffraction.

KW - SOLID-STATE NMR

KW - 5-COORDINATE SILICON

KW - MOLECULAR-SIEVES

KW - MEDIA

KW - TEMPLATE

KW - LOCATION

KW - COMPLEX

KW - IONS

KW - IFR

KW - STF

UR - http://www.scopus.com/inward/record.url?scp=11844289567&partnerID=8YFLogxK

M3 - Book

BT - Measuring the silion fluoride bond distance in zeolites

PB - Unknown Publisher

ER -

Measuring the silion fluoride bond distance in zeolites

Abstract

Keywords

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