Measuring picometre-level displacements using speckle patterns produced by an integrating sphere

Morgan Facchin; Graham David Bruce; Kishan Dholakia

doi:10.1038/S41598-023-40518-6

Measuring picometre-level displacements using speckle patterns produced by an integrating sphere

Morgan Facchin^*, Graham David Bruce^*, Kishan Dholakia

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

21 Downloads (Pure)

Abstract

As the fields of optical microscopy, semiconductor technology and fundamental science increasingly aim for precision at or below the nanoscale, there is a burgeoning demand for sub-nanometric displacement and position sensing. We show that the speckle patterns produced by multiple reflections of light inside an integrating sphere provide an exceptionally sensitive probe of displacement. We use an integrating sphere split into two equal and independent hemispheres, one of which is free to move in any given direction. The relative motion of the two hemispheres produces a change in the speckle pattern from which we can analytically infer the amplitude of the displacement. The method allows a noise floor of 5 pm/√Hz (λ/160, 000) above 30 Hz in a facile implementation, which we use to measure oscillations of 17 pm amplitude (λ/50, 000) with a signal to noise ratio of 3.

Original language	English
Article number	14607
Number of pages	8
Journal	Scientific Reports
Volume	13
DOIs	https://doi.org/10.1038/S41598-023-40518-6
Publication status	Published - 5 Sept 2023

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Final published version, 1.81 MBLicence: CC BY

M Squared - USTAN Biophotonics Nexus: M Sqaured - St Andrews Biophotonics Nexus
Dholakia, K. (PI)
EPSRC
1/11/17 → 31/10/22
Project: Standard
Resonant and shaped photonics for under: Resonant and shaped photonics for understanding the physical and biomedical world
Dholakia, K. (PI) & Gather, M. C. (CoI)
1/08/17 → 31/07/22
Project: Standard

Data underpinning "Measuring picometre-level displacements using speckle patterns produced by an integrating sphere"
Facchin, M. (Creator), Bruce, G. D. (Creator) & Dholakia, K. (Creator), University of St Andrews, 25 Aug 2023
DOI: 10.17630/e7798c1b-e851-449c-b360-857f70300e78
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Cite this

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abstract = "As the fields of optical microscopy, semiconductor technology and fundamental science increasingly aim for precision at or below the nanoscale, there is a burgeoning demand for sub-nanometric displacement and position sensing. We show that the speckle patterns produced by multiple reflections of light inside an integrating sphere provide an exceptionally sensitive probe of displacement. We use an integrating sphere split into two equal and independent hemispheres, one of which is free to move in any given direction. The relative motion of the two hemispheres produces a change in the speckle pattern from which we can analytically infer the amplitude of the displacement. The method allows a noise floor of 5 pm/√Hz (λ/160, 000) above 30 Hz in a facile implementation, which we use to measure oscillations of 17 pm amplitude (λ/50, 000) with a signal to noise ratio of 3.",

author = "Morgan Facchin and Bruce, {Graham David} and Kishan Dholakia",

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AB - As the fields of optical microscopy, semiconductor technology and fundamental science increasingly aim for precision at or below the nanoscale, there is a burgeoning demand for sub-nanometric displacement and position sensing. We show that the speckle patterns produced by multiple reflections of light inside an integrating sphere provide an exceptionally sensitive probe of displacement. We use an integrating sphere split into two equal and independent hemispheres, one of which is free to move in any given direction. The relative motion of the two hemispheres produces a change in the speckle pattern from which we can analytically infer the amplitude of the displacement. The method allows a noise floor of 5 pm/√Hz (λ/160, 000) above 30 Hz in a facile implementation, which we use to measure oscillations of 17 pm amplitude (λ/50, 000) with a signal to noise ratio of 3.

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Measuring picometre-level displacements using speckle patterns produced by an integrating sphere

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M Squared - USTAN Biophotonics Nexus: M Sqaured - St Andrews Biophotonics Nexus

Resonant and shaped photonics for under: Resonant and shaped photonics for understanding the physical and biomedical world

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Data underpinning "Measuring picometre-level displacements using speckle patterns produced by an integrating sphere"

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