Magnetoresistance of high mobility HgTe quantum dot films with controlled charging

Menglu Chen*, Xinzheng Lan, Margaret H. Hudson, Guohua Shen, Peter B. Littlewood, Dmitri V. Talapin, Philippe Guyot-Sionnest*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The magnetoresistance of HgTe quantum dot films, exhibiting a well-defined 1Se state charging and a relatively high mobility (1-10 cm2 V−1 s−1), is measured as a function of temperature down to 10 K and controlled occupation of the first electronic state. There is a positive-quadratic magnetoresistance which can be several 100% at low temperature and scales like x(1 − x) where x is the filling fraction of the lowest quantum dot state in the conduction band, 1Se. This positive magnetoresistance is orders of magnitude larger than the effect estimated from mobile carriers and it is attributed to the increased confinement induced by the magnetic field. There is also a negative magnetoresistance of 1-20% from 300 K to 10 K which is rather independent of the fractional occupation, and which follows a negative exponential dependence with the magnetic field. It can be empirically fit with an effective g-factor of ∼55 and it is tentatively attributed to the reduction of barrier heights by the Zeeman splitting of the 1Se state.

Original languageEnglish
Pages (from-to)13771-13777
Number of pages7
JournalJournal of Materials Chemistry C
Volume10
Issue number37
Early online date20 Jan 2022
DOIs
Publication statusE-pub ahead of print - 20 Jan 2022

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