Abstract
PbZr(0.52)Ti(0.48)O(3)/La(0.67)Sr(0.33)MnO(3)(PZT/LSMO) bilayer with surface roughness similar to 1.8 nm thin films have been grown by pulsed laser deposition on LaAlO(3)(LAO) substrates. High remnant polarization (30-54 mu C/cm(2)), dielectric constant (400-1700), and well saturated magnetization were observed depending upon the deposition temperature of the ferromagnetic layer and applied frequencies. Giant frequency-dependent change in dielectric constant and loss were observed above the ferromagnetic-paramagnetic temperature. The frequency dependent dielectric anomalies are attributed to the change in metallic and magnetic nature of LSMO and also the interfacial effect across the bilayer; an enhanced magnetoelectric interaction may be due to the Parish-Littlewood mechanism of inhomogeneity near the metal-dielectric interface.
| Original language | English |
|---|---|
| Article number | 072904 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 96 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 15 Feb 2010 |
Keywords
- dielectric losses
- dielectric polarisation
- dielectric thin films
- ferromagnetic materials
- ferromagnetic-paramagnetic transitions
- lanthanum compounds
- lead compounds
- magnetisation
- magnetoelectric effects
- multiferroics
- permittivity
- pulsed laser deposition
- strontium compounds
- surface roughness
- THIN-FILMS
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