Magnetic effects on dielectric and polarization behavior of multiferroic heterostructures

Sandra Dussan; Ashok Kumar; J. F. Scott; Ram S. Katiyar

doi:10.1063/1.3327889

Magnetic effects on dielectric and polarization behavior of multiferroic heterostructures

Sandra Dussan, Ashok Kumar^*, J. F. Scott, Ram S. Katiyar

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

PbZr(0.52)Ti(0.48)O(3)/La(0.67)Sr(0.33)MnO(3)(PZT/LSMO) bilayer with surface roughness similar to 1.8 nm thin films have been grown by pulsed laser deposition on LaAlO(3)(LAO) substrates. High remnant polarization (30-54 mu C/cm(2)), dielectric constant (400-1700), and well saturated magnetization were observed depending upon the deposition temperature of the ferromagnetic layer and applied frequencies. Giant frequency-dependent change in dielectric constant and loss were observed above the ferromagnetic-paramagnetic temperature. The frequency dependent dielectric anomalies are attributed to the change in metallic and magnetic nature of LSMO and also the interfacial effect across the bilayer; an enhanced magnetoelectric interaction may be due to the Parish-Littlewood mechanism of inhomogeneity near the metal-dielectric interface.

Original language	English
Article number	072904
Number of pages	3
Journal	Applied Physics Letters
Volume	96
Issue number	7
DOIs	https://doi.org/10.1063/1.3327889
Publication status	Published - 15 Feb 2010

Keywords

dielectric losses
dielectric polarisation
dielectric thin films
ferromagnetic materials
ferromagnetic-paramagnetic transitions
lanthanum compounds
lead compounds
magnetisation
magnetoelectric effects
multiferroics
permittivity
pulsed laser deposition
strontium compounds
surface roughness
THIN-FILMS

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10.1063/1.3327889

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@article{9b403bc4e923436ba86c7aa5ae18d927,

title = "Magnetic effects on dielectric and polarization behavior of multiferroic heterostructures",

abstract = "PbZr(0.52)Ti(0.48)O(3)/La(0.67)Sr(0.33)MnO(3)(PZT/LSMO) bilayer with surface roughness similar to 1.8 nm thin films have been grown by pulsed laser deposition on LaAlO(3)(LAO) substrates. High remnant polarization (30-54 mu C/cm(2)), dielectric constant (400-1700), and well saturated magnetization were observed depending upon the deposition temperature of the ferromagnetic layer and applied frequencies. Giant frequency-dependent change in dielectric constant and loss were observed above the ferromagnetic-paramagnetic temperature. The frequency dependent dielectric anomalies are attributed to the change in metallic and magnetic nature of LSMO and also the interfacial effect across the bilayer; an enhanced magnetoelectric interaction may be due to the Parish-Littlewood mechanism of inhomogeneity near the metal-dielectric interface.",

keywords = "dielectric losses, dielectric polarisation, dielectric thin films, ferromagnetic materials, ferromagnetic-paramagnetic transitions, lanthanum compounds, lead compounds, magnetisation, magnetoelectric effects, multiferroics, permittivity, pulsed laser deposition, strontium compounds, surface roughness, THIN-FILMS",

author = "Sandra Dussan and Ashok Kumar and Scott, {J. F.} and Katiyar, {Ram S.}",

year = "2010",

month = feb,

day = "15",

doi = "10.1063/1.3327889",

language = "English",

volume = "96",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "7",

}

TY - JOUR

T1 - Magnetic effects on dielectric and polarization behavior of multiferroic heterostructures

AU - Dussan, Sandra

AU - Kumar, Ashok

AU - Scott, J. F.

AU - Katiyar, Ram S.

PY - 2010/2/15

Y1 - 2010/2/15

N2 - PbZr(0.52)Ti(0.48)O(3)/La(0.67)Sr(0.33)MnO(3)(PZT/LSMO) bilayer with surface roughness similar to 1.8 nm thin films have been grown by pulsed laser deposition on LaAlO(3)(LAO) substrates. High remnant polarization (30-54 mu C/cm(2)), dielectric constant (400-1700), and well saturated magnetization were observed depending upon the deposition temperature of the ferromagnetic layer and applied frequencies. Giant frequency-dependent change in dielectric constant and loss were observed above the ferromagnetic-paramagnetic temperature. The frequency dependent dielectric anomalies are attributed to the change in metallic and magnetic nature of LSMO and also the interfacial effect across the bilayer; an enhanced magnetoelectric interaction may be due to the Parish-Littlewood mechanism of inhomogeneity near the metal-dielectric interface.

AB - PbZr(0.52)Ti(0.48)O(3)/La(0.67)Sr(0.33)MnO(3)(PZT/LSMO) bilayer with surface roughness similar to 1.8 nm thin films have been grown by pulsed laser deposition on LaAlO(3)(LAO) substrates. High remnant polarization (30-54 mu C/cm(2)), dielectric constant (400-1700), and well saturated magnetization were observed depending upon the deposition temperature of the ferromagnetic layer and applied frequencies. Giant frequency-dependent change in dielectric constant and loss were observed above the ferromagnetic-paramagnetic temperature. The frequency dependent dielectric anomalies are attributed to the change in metallic and magnetic nature of LSMO and also the interfacial effect across the bilayer; an enhanced magnetoelectric interaction may be due to the Parish-Littlewood mechanism of inhomogeneity near the metal-dielectric interface.

KW - dielectric losses

KW - dielectric polarisation

KW - dielectric thin films

KW - ferromagnetic materials

KW - ferromagnetic-paramagnetic transitions

KW - lanthanum compounds

KW - lead compounds

KW - magnetisation

KW - magnetoelectric effects

KW - multiferroics

KW - permittivity

KW - pulsed laser deposition

KW - strontium compounds

KW - surface roughness

KW - THIN-FILMS

U2 - 10.1063/1.3327889

DO - 10.1063/1.3327889

M3 - Article

SN - 0003-6951

VL - 96

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 7

M1 - 072904

ER -

Magnetic effects on dielectric and polarization behavior of multiferroic heterostructures

Abstract

Keywords

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