Magnetic effects on dielectric and polarization behavior of multiferroic heterostructures

Sandra Dussan, Ashok Kumar*, J. F. Scott, Ram S. Katiyar

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

52 Citations (Scopus)

Abstract

PbZr(0.52)Ti(0.48)O(3)/La(0.67)Sr(0.33)MnO(3)(PZT/LSMO) bilayer with surface roughness similar to 1.8 nm thin films have been grown by pulsed laser deposition on LaAlO(3)(LAO) substrates. High remnant polarization (30-54 mu C/cm(2)), dielectric constant (400-1700), and well saturated magnetization were observed depending upon the deposition temperature of the ferromagnetic layer and applied frequencies. Giant frequency-dependent change in dielectric constant and loss were observed above the ferromagnetic-paramagnetic temperature. The frequency dependent dielectric anomalies are attributed to the change in metallic and magnetic nature of LSMO and also the interfacial effect across the bilayer; an enhanced magnetoelectric interaction may be due to the Parish-Littlewood mechanism of inhomogeneity near the metal-dielectric interface.

Original languageEnglish
Article number072904
Number of pages3
JournalApplied Physics Letters
Volume96
Issue number7
DOIs
Publication statusPublished - 15 Feb 2010

Keywords

  • dielectric losses
  • dielectric polarisation
  • dielectric thin films
  • ferromagnetic materials
  • ferromagnetic-paramagnetic transitions
  • lanthanum compounds
  • lead compounds
  • magnetisation
  • magnetoelectric effects
  • multiferroics
  • permittivity
  • pulsed laser deposition
  • strontium compounds
  • surface roughness
  • THIN-FILMS

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