Investigating the effects of reduced size on the properties of ferroelectrics

Mohamed M. Saad, Paul Baxter, Jonny McAneney, Akeela Lookman, Lesley J. Sinnamon, Paul Evans, Alina Schilling, Tim Adams, Xinhua Zhu, Robert J. Pollard, Robert M. Bowman, J. Marty Gregg, Dong Jin Jung, Finlay D Morrison, James F. Scott

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)

Abstract

A series of experiments has been undertaken to understand more about the fundamental origin of the thickness-induced permittivity collapse often observed in conventional thin film ferroelectric heterostructures. The various experiments are discussed, highlighting the eventual need to examine permittivity collapse in thin film single crystal material. It has been seen that dielectric collapse is not a direct consequence of reduced size, and neither is it a consequence of unavoidable physics associated with the ferroelectric-electrode boundary.

Research on three-dimensional shape-constrained ferroelectrics, emphasizing self-assembled structures based on nanoporous alumina templates and on FIB-milled single crystals, is also presented, and appears to represent an exciting area for ongoing research.

Original languageEnglish
Pages (from-to)2208-2225
Number of pages18
JournalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume53
Issue number12
DOIs
Publication statusPublished - Dec 2006

Keywords

  • THIN-FILM CAPACITORS
  • DIELECTRIC-PROPERTIES
  • BARIUM-TITANATE
  • LAYER THICKNESS
  • SINGLE-CRYSTAL
  • DEPENDENCE
  • (BA,SR)TIO3
  • ELECTRODES
  • DEPOSITION
  • CONDUCTION

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