Abstract
A detailed recipe is given for the refinement of in-plane lattice-parameter and crystallite-size values of a turbostratic graphite-like structure through the profile fitting of the diffraction peaks from random layers. Folding of the theoretical line shape with the experimentally measured instrumental function provides convenient correction for systematic broadening. The devised technique is applied to the analysis of turbostratic hexagonal boron nitrides.
| Original language | English |
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| Pages (from-to) | 767-771 |
| Number of pages | 5 |
| Journal | Journal of Applied Crystallography |
| Volume | 27 |
| Publication status | Published - 1 Oct 1994 |