Inferential statistics of electron backscatter diffraction data from within individual crystalline grains

Peter Edmund Jupp, Bachmann Florian, Ralph Hielscher, Wolfgang Pantleon, Helmut Schaeben, Elias Wegert

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1338-1355
Number of pages	18
Journal	Journal of Applied Crystallography
Volume	43
DOIs	https://doi.org/10.1107/S002188981003027X
Publication status	Published - 2010

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title = "Inferential statistics of electron backscatter diffraction data from within individual crystalline grains",

author = "Jupp, \{Peter Edmund\} and Bachmann Florian and Ralph Hielscher and Wolfgang Pantleon and Helmut Schaeben and Elias Wegert",

year = "2010",

doi = "10.1107/S002188981003027X",

language = "English",

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journal = "Journal of Applied Crystallography",

issn = "0021-8898",

publisher = "International Union of Crystallography",

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TY - JOUR

T1 - Inferential statistics of electron backscatter diffraction data from within individual crystalline grains

AU - Jupp, Peter Edmund

AU - Florian, Bachmann

AU - Hielscher, Ralph

AU - Pantleon, Wolfgang

AU - Schaeben, Helmut

AU - Wegert, Elias

PY - 2010

Y1 - 2010

UR - https://www.scopus.com/pages/publications/78649501744

U2 - 10.1107/S002188981003027X

DO - 10.1107/S002188981003027X

M3 - Article

SN - 0021-8898

VL - 43

SP - 1338

EP - 1355

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

ER -